Semiconductor Tester Solutions for Automotive
Delivering reliable solutions supporting the stringent quality requirements of “Zero Defects”.
Test instrumentation for a wide range of modern automotive applications such as ADAS, CAN/LIN, and power management devices for xEV.
Cohu Tester Experience
Diamondx Test System
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.
Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.
Diamondx DxV Test System
Changes the Rules of Design Through to Production Test
The Diamondx DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinet. The DxV is completely stand-alone, so it can be placed on a bench or desktop:
PAx Test System
Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices
PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.
PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.
Automotive Test Composite Pin
Analog Time Measurement Processor
High Voltage, High Current Floating Programmable Power Supply
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
High Density Voltage Current Instrument for Massive Multisite Test
High Power Voltage/Current Programmable Power Source
Scalable, Cost-Efficient Solution for High Performance SerDes Test
High Speed Solution for SerDes/LVDS/MIPI Interfaces
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces
Optimized Solution for LVDS Port and DDR Memory Port Test
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
Test Solution for Ultra High Definition Display Driver ICs
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs
4 Channel Floating VI for applications requiring higher power, floating VI
Quad time measurement processor
5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7
Precision voltage/current source and measurement with advanced features
Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices
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