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Semiconductor ATE Solutions for Automotive

Delivering reliable solutions supporting the stringent quality requirements of “Zero Defects”

Cohu Automotive Market Test Solutions

Cohu ATE Experience

  • Test instrumentations for a wide range of modern automotive applications such as ADAS, CAN/LIN and Power
  • Leading automotive market experience in semiconductor ATE
  • First automotive radar test cell in production

Applications

  • ADAS
  • Electric Vehicle
  • Driver Comfort
  • V2V/V2X
  • Market Attributes Drivers: automation, Industry 4.0

Test Systems Solutions

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

Changes the Rules of Design Through to Production Test

The Diamondx DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinet. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, zero footprint, light weight, single box design
  • Air-cooled with low ambient noise for an office environment
  • Energy-efficient, low power consumption
  • Ideal for lab development and high-volume production

Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices

PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.

PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.

Instrumentation Solutions

Automotive Test Composite Pin

  • Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
  • Reduced load board complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resources to DUT pin connections
  • Transient detect capability to capture perturbations at the device in program development or production test

Analog Time Measurement Processor

  • Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
  • Reduced loadboard complexity using the SmartMux for high voltage timing measurements

High Voltage, High Current Floating Programmable Power Supply

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
  • Expert mode to maximize energy efficiency of the instrument

General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

High Density Voltage Current Instrument for Massive Multisite Test

  • Highest V/I pin density in the industry
  • Voltage/current supply (VIS) mode
  • Precision analog source (PAS) mode
  • Flexible triggering options
  • External input matrix

High Power Voltage/Current Programmable Power Source

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing

Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level mixed-signal testing using deep send pattern memory

High Speed Solution for SerDes/LVDS/MIPI Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level testing using deep send and receive pattern memory

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

  • Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.

4 Channel Floating VI for applications requiring higher power, floating VI

  • Full four quadrant operation providing pulsed current up to 5 A per channel over a range of +/- 60 V
  • Can be internally paralleled for operation up to 20 A and can be stacked up to 240 V
  • Auto sequencer, meter per-pin and ripple input

Quad time measurement processor

  • Four independent time measurement channels per board
  • Each channel has its own direct path to DUT which can be programmed over 3 voltage ranges and 3 selectable filters

5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7

  • Only cost optimized ATE solution that covers sub-8.5 GHz with instrument extension to 18 GHz with high power
  • Best-in-class ATE EVM and modulation bandwidth with faster acquisition times across frequency and ranges
  • Single platform covering <4G, 5G sub-8.5 GHz, Wi-Fi 6/6E/7 and mmWave
  • Seamless On-site Field Upgradable
  • Significant increase in performance and throughput with minimal cost of change

Precision voltage/current source and measurement with advanced features

  • Four Quadrant VI Source/Measure
  • Ganging capability for extended current range
  • 4:1 SmartMux
  • Differential Vmeas
  • +/-20 V / 300 mA, +/- 60 V / 100 Ma
  • AWG and Digitizer Functions

Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices

  • Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
  • A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
  • A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument

Expertise

Learn more about our Semiconductor ATE Solutions