Demo Videos
Watch demo videos of different modules and functionalities within the PAICe Digital Twin Platform

PAICe Digital Twin Platform™ is the high-performance, AI-driven data platform for semiconductor manufacturers that accelerates every step of your analytics and application delivery. Our patented compression techniques provide up to 5x faster data access, 10x faster visualization of live and historical datasets, and rapid app development in days – not months. By combining automated feature extraction with low-code AI tools, PAICe eliminates coding bottlenecks and fragmented data, giving teams real-time insights and the agility to innovate at speed – on an enterprise-ready, re-engineered digital twin data fabric.
Unscheduled downtime is one of the costliest disruptions in high-volume semiconductor manufacturing. PAICe Prescriptive™ dramatically reduces the risk of unexpected equipment failures by detecting early warning signs—allowing for proactive intervention before problems impact production. This ensures continuous operation of both test handler and inspection platforms, keeping throughput high and meeting delivery commitments.
AI Assistant in PAICe Monitor utilizes LLM agents that are embedded in the application to drastically simplify previously arduous tasks. Chat agents alleviate the learning curve for new applications. AI Assistant allows users to query & analyze data and deploy analytics using Natural Language. It enables faster trouble shooting and signal analysis, resulting in explainable AI – every output includes a rationale or explanation.
Correlations feature in PAICe Monitor is designed to automate mathematical analysis to uncover root causes of process issues by analyzing trace data and logistics from manufacturing tools. Smart contextualization offers deep integration of trace and logistics data for richer insights. User-friendly visualization presents clear plots and distributions that are easy to interpret. Accelerator for new engineers helps less experienced users quickly understand key process drivers.
Trace Viewer feature in PAICe Monitor enables rapid, intuitive visualization and analysis of tool trace data to support troubleshooting, anomaly detection, and process optimization. Embedded feature extraction requires no manual setup and automatically utilizes data from MES and logistics systems. Interactive metadata exploration allows users to hover and zoom for detailed insights. Intuitive troubleshooting enables engineers to identify and resolve tool issues within minutes.
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