The MCT FH-1200 is a high-throughput film frame test handler designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted.
Product Information
Description | FH-1200 |
---|---|
Changeover (frame size, load board) | Less than 15 minutes |
Device Changeover (Recipe Change) | Less than 1 minute |
Multi-site Test | Single site to massively parallel |
Temperature | Ambient; hot capability available shortly |
Jam Rate | Less than 1 jam in 1000 rings run |
Film Frame Carriers Supported | Standard frames for 200 mm and 300 mm wafer rings |
Maximum number of Cassette | 2 input and 2 output cassettes, 1 reject cassette with reduced number of slots, on output side |
Package Types | QFN/QFN lead frames, WLCSP, other tape mounted package types |
Reject Mark Laser | Rofin, Alltec, Keteca (other integrated upon requested) |
Data Collection, Reporting | Full compatibility with Cell Controller/Smart Track |
Contactor Compatibility | Both pogo pin style strip contactors and probe cards |
Docking Method | Both direct or cable docking |
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