The MCT FH-1200 is a high-throughput film frame test handler designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted.
|Changeover (frame size, load board)||Less than 15 minutes|
|Device Changeover (Recipe Change)||Less than 1 minute|
|Multi-site Test||Single site to massively parallel|
|Temperature||Ambient; hot capability available shortly|
|Jam Rate||Less than 1 jam in 1000 rings run|
|Film Frame Carriers Supported||Standard frames for 200 mm and 300 mm wafer rings|
|Maximum number of Cassette||2 input and 2 output cassettes, 1 reject cassette with reduced number of slots, on output side|
|Package Types||QFN/QFN lead frames, WLCSP, other tape mounted package types|
|Reject Mark Laser||Rofin, Alltec, Keteca (other integrated upon requested)|
|Data Collection, Reporting||Full compatibility with Cell Controller/Smart Track|
|Contactor Compatibility||Both pogo pin style strip contactors and probe cards|
|Docking Method||Both direct or cable docking|
Complete our contact form.
Learn more about our Test Handler and Inspection Solutions