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DxV Test System

Changes the Rules of Design Through to Production Test

The DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, zero footprint, light weight, single box design
  • Air cooled with low ambient noise for office environment
  • Energy efficient, low power consumption
  • Ideal for lab development and high-volume production
Cohu DxV Semiconductor ATE Test System
  • Highlights

    • Full semiconductor ATE performance in a desktop PC footprint
    • Compact, lightweight, single box design
    • Portability using castors or light-weight manipulator
    • Designed for use in lab, office or production test floor
    • High throughput
    • Broad range of proven test technologies including high speed and high density

  • Key Features

    • Leverages Cohu’s Diamondx test system high-performance PCIe architecture
    • Workstation fully integrated inside system
    • 5 instruments slots configurable with range of Cohu’s Diamondx test system instruments
    • Unison software compatibility with other Cohu test platforms
    • True zero footprint production set up
    • Post silicon validation and evaluation
    • Engineering samples or quality testing and analysis
    • High throughput wafer and WLCSP test applications
    • Low lot sized samples or quality test and analysis
  • Architecture

    • Universal slot architecture shared with Cohu’s Diamondx test system
    • Simple re-configuring of the system to cover a broad range of applications
    • A range of digital, analog and DSP instruments
    • PCI-Express2 Data Bus up to 80Gbps bi-directional transfer between system CPU and test-head
    • Unison OS offering a complete suite of test software tools including such scan test, concurrent test, adaptive test, unit level traceability multi-site setup
    • System level calibration and diagnostics
  • Applications

    • IoT and sensor device testing
    • Post silicon validation and evaluation
    • Engineering samples or quality testing and analysis
    • High throughput wafer and WLCSP test applications
    • Low lot sized samples or quality test and analysis
    • Test a broad range of devices
      • Automotive
      • Baseband and applications processor devices
      • Consumer SOC
      • Flat Panel Display/DTV
      • IoT and Sensors
      • Microcontrollers
      • PC peripherals SOC

Additional Information

Scalable

The DxV changes the rules of the design through to production test flow. It provides both the flexibility and compact size to be used in offices or small benchtop lab situations but with high performance, high density instrumentation to deliver real ATE performance in high volume production test environments.

Can be Used as a Validation Tool or for Initial Production

The DxV uses the same proven architecture as the successful Diamondx and with its ultra-compact footprint and links to other design validation tools, can be easily used to meet the needs of silicon validation and initial production stages. With these links to approved 3rd party software tools for silicon validation and 3rd party hardware instrumentation, the DxV is the ideal pre-production engineering test system.

Smallest Footprint for a High Performance SOC Test System

The test system is a self-contained unit with an embedded high-performance Linux controller running Cohu’s Unison test environment and associated tools. The ‘single box’ design and low overall weight enables true zero footprint test floor impact when docked to probe or final test material handlers.

Typically, less than 50 lbs for the basic system, with air cooling and single-phase low power supply requirements of 200-240 V, the Cost of Ownership economics with respect to facilities costs are significantly reduced compared to traditional high performance ATE.

Part of the Diamondx Family

The DxV has five high throughput Diamondx compatible slots allowing configuration of a range of Diamondx instrumentation, digital options spanning high density 192 channel general purpose full featured digital pins to memory port and high-speed serial of 6.4 Gbps.

DC and mixed signal instrumentation include 72 channel VI solutions and 24 bit converter options.

The DxV is a full featured ATE in a desktop size which delivers flexibility and enables use limited only by imagination.

Instrumentation

DC and Power Instrumentation

DPS16
16 Channel Device Power Supply

  • Cost effective solution for multi-site testing
  • 6 V force and measure up to 2 A output
  • Channels can be ganged to achieve up to 16 A
  • Four current ranges enable better accuracy

DPS1x
High Performance Device Power Supply

  • Multisite testing of multi-core application processors and other high current, low voltage devices
  • Drop-in replacement for DPS16 with enhanced capabilities

HDVI
High Density Voltage Current Instrument for Massive Multi-site Test

  • Highest V/I pin density in the industry
  • Voltage/current supply (VIS) mode
  • Precision analog source (PAS) mode
  • Flexible triggering options
  • External input matrix

PD1x / PD2x
Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

PMVIx
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

  • Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps

VIS16
Precision Voltage/Current Source and Measurement with Advanced Features

  • 16 Channel, four quadrant voltage/current source and measure
  • AWG and digitizer functions
  • Time measurement
  • Differential voltage measures
  • Timers, triggers and gates
  • Alarms

Digital Instrumentation

DPIN-96

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

GX1x

General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

MP1x

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

Mixed Signal and DSP Instrumentation

DIG-HSB
Hummingbird Digitizer

  • Four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer
  • Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance
  • Offers an analog bandwidth of up to 800 MHz
  • DIGHB is supported on PAx and Diamondx

MultiWave
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

SerDes Instrumentation

HSI1x

Scalabale, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

HSI2x

High Speed Solution for SerDes/LVDS/MIPI Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level testing using deep send and receive pattern memories

Time Measurement

ATMPx
Analog Time Measurement Processor

  • Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
  • Reduced loadboard complexity using the SmartMux for high voltage timing measurements

Instrument by Name

  • AT1x – Automotive Test Composite Pin
  • ATMPx – Analog Time Measurement Processor
  • DCTMx – Precision Data Converter Test Module
  • DPIN96 – High-Value Solution for Testing Digital and Mixed-Signal Devices
  • DPS16  – Device Power Supply
  • DPS1x – High Performance Device Power Supply
  • GX1x – General-Purpose Digital Instrument for Digital ASSP, Analog ASSP and MCU Digital Testing
  • HDVI – High Density Voltage/Current Floating Programmable Power Supply
  • HSI1x – Scalable, Cost-Efficient Solution for High Performance SerDes Tets
  • HSI2x – High Speed Solution for SerDes/LVDS/MIPI Interfaces
  • HSIO: 8 Lane SerDes Instrument for Testing of High Speed Serial Interfaces
  • MP1x – Optimized Solution for LVDS Port and DDR Memory Port Test
  • MultiWave – Highly Integrated Mixed-Signal Instrument
  • PD1x / PD2x – Test Solution for Ultra High Definition Display Driver ICs
  • PMVIx – Voltage/Current Source for Mobile Power Management, ASSP, Automotive and MCU ICs
  • VIS16 – Precision Voltage/Current Source and Measurement with Advanced Features