DPIN-96
High-Value Solution for Testing Digital and Mixed-Signal Devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
GX1x
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
- Flexible pattern memory allocations
- Multiple pattern generation
- Transmit and receive of digitized waveforms
- Pattern synchronization and control of DC and AC analog test instruments
HSI1x
Scalabale, Cost-Efficient Solution for High Performance SerDes Test
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI2x
High Speed Solution for SerDes/LVDS/MIPI Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level testing using deep send and receive pattern memories
MP1x
Optimized Solution for LVDS Port and DDR Memory Port Test
- Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
- Supporting built-in memory protocol support
- Same cycle match capability to support for data latency of up to 8 cycles
