Diamondx DxV™ semiconductor tester is a self-contained unit with an embedded high-performance Linux controller running Cohu’s Unison test environment and associated tools. The ‘single box’ design and low overall weight enables true zero footprint test floor impact when docked to probe or final test material handlers.
Instrumentation
Automotive
ATMPx
Analog Time Measurement Processor
- Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
- Reduced loadboard complexity using the SmartMux for high voltage timing measurements
DC and Power Instrumentation
DPS16
16 Channel Device Power Supply
- Cost effective solution for multi-site testing
- 6 V force and measure up to 2 A output
- Channels can be ganged to achieve up to 16 A
- Four current ranges enable better accuracy
DPS1x
High Performance Device Power Supply
- Multisite testing of multi-core application processors and other high current, low voltage devices
- Drop-in replacement for DPS16 with enhanced capabilities
HDVI
High Density Voltage Current Instrument for Massive Multi-site Test
- Highest V/I pin density in the industry
- Voltage/current supply (VIS) mode
- Precision analog source (PAS) mode
- Flexible triggering options
- External input matrix
PD1x / PD2x
Test Solution for Ultra High Definition Display Driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
PMVIx
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs
- Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps
VIS16
Precision Voltage/Current Source and Measurement with Advanced Features
- 16 Channel, four quadrant voltage/current source and measure
- AWG and digitizer functions
- Time measurement
- Differential voltage measures
- Timers, triggers and gates
- Alarms
Digital Instrumentation
DPIN-96
High-Value Solution for Testing Digital and Mixed-Signal Devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
GX1x
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
- Flexible pattern memory allocations
- Multiple pattern generation
- Transmit and receive of digitized waveforms
- Pattern synchronization and control of DC and AC analog test instruments
HSI1x
Scalabale, Cost-Efficient Solution for High Performance SerDes Test
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI2x
High Speed Solution for SerDes/LVDS/MIPI Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level testing using deep send and receive pattern memories
MP1x
Optimized Solution for LVDS Port and DDR Memory Port Test
- Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
- Supporting built-in memory protocol support
- Same cycle match capability to support for data latency of up to 8 cycles
Mixed Signal and DSP Instrumentation
MultiWave
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
- Wide bandwidth analog source
- Wide bandwidth analog capture
- Flexible triggering
- High-precision PMU
- Protected I/O channels
- Simpler test boards
- Mixed-signal software support
Instrument by Name
- ATMPx – Analog Time Measurement Processor
- DPIN96 – High-Value Solution for Testing Digital and Mixed-Signal Devices
- DPS16 – Device Power Supply
- DPS1x – High Performance Device Power Supply
- GX1x – General-Purpose Digital Instrument for Digital ASSP, Analog ASSP and MCU Digital Testing
- HDVI – High Density Voltage/Current Floating Programmable Power Supply
- HSI1x – Scalable, Cost-Efficient Solution for High Performance SerDes Tets
- HSI2x – High Speed Solution for SerDes/LVDS/MIPI Interfaces
- HSIO: 8 Lane SerDes Instrument for Testing of High Speed Serial Interfaces
- MP1x – Optimized Solution for LVDS Port and DDR Memory Port Test
- MultiWave – Highly Integrated Mixed-Signal Instrument
- PD2x – Test Solution for Ultra High Definition Display Driver ICs
- PMVIx – Voltage/Current Source for Mobile Power Management, ASSP, Automotive and MCU ICs
- VIS16 – Precision Voltage/Current Source and Measurement with Advanced Features
Additional Information
Scalable
The DxV changes the rules of the design through to production test flow. It provides both the flexibility and compact size to be used in offices or small benchtop lab situations but with high performance, high density instrumentation to deliver real ATE performance in high volume production test environments.
Can be Used as a Validation Tool or for Initial Production
The DxV uses the same proven architecture as the successful Diamondx and with its ultra-compact footprint and links to other design validation tools, can be easily used to meet the needs of silicon validation and initial production stages. With these links to approved 3rd party software tools for silicon validation and 3rd party hardware instrumentation, the DxV is the ideal pre-production engineering test system.
Smallest Footprint for a High Performance SOC Test System
The test system is a self-contained unit with an embedded high-performance Linux controller running Cohu’s Unison test environment and associated tools. The ‘single box’ design and low overall weight enables true zero footprint test floor impact when docked to probe or final test material handlers.
Typically, less than 50 lbs for the basic system, with air cooling and single-phase low power supply requirements of 200-240 V, the Cost of Ownership economics with respect to facilities costs are significantly reduced compared to traditional high performance ATE.
Part of the Diamondx Family
The DxV has five high throughput Diamondx compatible slots allowing configuration of a range of Diamondx instrumentation, digital options spanning high density 192 channel general purpose full featured digital pins to memory port and high-speed serial of 6.4 Gbps.
DC and mixed signal instrumentation include 72 channel VI solutions and 24 bit converter options.
The DxV is a full featured ATE in a desktop size which delivers flexibility and enables use limited only by imagination.
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Expertise
Learn more about our Semiconductor Tester Solutions.
