Interface Solutions for RF
5G wireless devices.
Demand for wireless communication and instantaneous data transfer are driving high bandwidth integrated RF devices.
ACE Contactor / Probe Head
Cost Efficient RF Contactor for FBGA and Wafer-Level Packages
ACE Test Contactor offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm and superior performance for current consumption, gain, standard deviation, and power efficiency.
ACE Probe Head provides exceptional electrical performance, both DC and RF and is manufactured from HyperCore™ base material, which is a proprietary material of Cohu’s ECT Contact Product Group.
Compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors.
Atlas Contactor / Probe Head
Optimal Performance for Large I/O Count Devices and High-End Digital
QuadTech probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance
Atlas offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
The cruciform tip provides increased tip rigidity with a much greater immunity to breakage. The advantages for the customer include increased run times between contactor cleaning, increased probe life, increased yield, and reduced system down time for contactor maintenance.
cBoa Contactor / Probe Head
Cost-Effective, High-Performance Contactor or Probe Head for High-Volume Production Test
cBoa contactors and probe heads are the solution for contacting high frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogenous DUT side plunger provides longer run times between cleaning and increased probe life.
The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C. With a bandwidth up to 27 GHz, cBoa can be used to test some of the highest frequency devices.
The enhanced compliance window accommodates package stack height tolerances well.
Excellent RF Performance with Low Cost of Ownership
cDragon pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.
By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
cDragon’s low profile and high bandwidth with low inductance makes it an ideal contacting solution for testing of mobile communications, RF switches, A/D converters, LNA’s, and PMIC devices. cDragon’s pins affinity to solder migration will ensure low and repeatable contact resistance.
cDragon can be used for testing any perimeter pad devices (QFN, DFN, PLCC) and leaded packages (QFP, SO).
cRacer Contactor / Probe Head
Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz
cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.
cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
cViper Probe Head
High Performance Probe Head for High Volume Production Test
cViper is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
ICON Coaxial Contactor
Coaxial production solution for testing high end digital applications to 60 Gbps
Designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).
The ICON’s metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise
Mercury Contactor / Probe Head
Industry preferred high performance, high value, low cost QuadTech contacting solution
Mercury probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields. Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.
RF Scrub Contactor
Excellent RF performance with low cost of ownership
Extremely short signal path rugged probe with high wear resistance for SO, DFN, and QFN packages
RF Scrub Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range (-40º C to +150º C).
The RF Scrub contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.
The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.
The RF Scrub contactor is adaptable to multiple packages (QFN/DFN/MLF, QFP, SO, SOT, TO) and handler platforms making it an ideal low-cost solution for your RF and acoustic applications.
xWave Contactor / Probe Head
Broadband Production Solution for cmWave and mmWave up to 100 GHz
The xWave contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication xWave contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.