Interface Solutions for RF
5G wireless devices, mmWave RF Transceivers.
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Demand for wireless communication and instantaneous data transfer are driving high bandwidth integrated RF devices.
Device Requirements
- High frequency
- Low noise
- High gain
- Advanced power delivery
Contactor Requirements
- Low loss (>40 GHz)
- High isolation (>60 dB)
- Low inductance (<0.1 nH)
- Matched impedance (50 Ω +/- 5%)
Applications
- 5G wireless devices 2.4 GHz to 28 GHz to 39 GHz to >80 GHz
- Automotive Radar/5G/WiGif/UltraGig: receivers, transceivers, high gain amplifiers, LNAs, switches, RF SoCs/SiPs
Test Contactor (Socket) / Probe Head Solutions
cBoa Contactor / Probe Head
Cost-Effective, High-Performance Contactor or Probe Head for High-Volume Production Test
cBoa contactors and probe heads are the solution for contacting high frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogenous DUT side plunger provides longer run times between cleaning and increased probe life.
The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C. With a bandwidth up to 27 GHz, cBoa can be used to test some of the highest frequency devices.
The enhanced compliance window accommodates package stack height tolerances well.
cViper Probe Head
High Performance Probe Head for High Volume Production Test
cViper is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
E-Series Spring Probe Contactors
Custom Probes and Test Contactor Solutions up to 60 GHz
Our E-Series® probes offer a comprehensive portfolio designed for versatile testing applications—from bare boards to surface mount assemblies and more. Whether you need off-the-shelf options or fully customized solutions, we deliver performance, reliability, and value.
Providing test probe solutions, probe customization services and failure analysis capability are part of our core competencies.
HYDRA Series Contactor / Probe Head
Common Test Height Probe Product Line.
Engineered for excellence and efficiency, HYDRA™ Series spring probe series offers precision, reliability, and standardized semiconductor test interface. Designed to be best-in-class at a competitive price point, HYDRA is optimized to maximize your operational efficiency. HYDRA is built to withstand demanding high-volume manufacturing test environments with its robust and durable design. With a common test-height, HYDRA offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, HYDRA streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
HYDRA COAX Coaxial Contactor
Coaxial production solution for testing high end digital applications to 60 Gbps
Designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).
The HYDRA COAX’s metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise
HYDRA RF Contactor / Probe Head
Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz
HYDRA RF utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.
HYDRA RF features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
HYDRA xW Contactor / Probe Head
Broadband Production Solution for cmWave and mmWave up to 100 GHz
The HYDRA xW contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the HYDRA xW contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication HYDRA xW contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.
Mercury Contactor / Probe Head
Industry preferred high performance, high value, low cost QuadTech contacting solution
Mercury probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields. Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.
RF Scrub Contactor
Excellent RF performance with low cost of ownership
Extremely short signal path rugged probe with high wear resistance for SO, DFN, and QFN packages
RF Scrub Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range (-40º C to +150º C).
The RF Scrub contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.
The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.
The RF Scrub contactor is adaptable to multiple packages (QFN/DFN/MLF, QFP, SO, SOT, TO) and handler platforms making it an ideal low-cost solution for your RF and acoustic applications.
ULTRA-S Contactor
Durable. Long Lifespan. Higher Test Yield.
The ULTRA®-S cantilever spring contactor is engineered for high yield and consistent performance in the most demanding environments. Unlike traditional elastomer-based interfaces, ULTRA-S eliminates performance degradation caused by compression set, temperature, and humidity exposure.
Expertise
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