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Industry-leading high current/voltage Kelvin solutions for xEV applications with steep signal rise/fall times, and outstanding lifespan by innovative contact material and coatings.
- High current
- High voltage
- Power delivery, high frequency
- Kelvin capability
- High current (500 A)
- High contact force (70 g) & wipe
- Minimum cleaning intervals (100 K cycles)
- Multisite testing (16x)
- Enhanced temperature performance from -60°C to 200°C
- LED drivers
- Motor drivers
- Power management ICs
- Voltage regulators
Test Contactor (Socket) / Probe Head Solutions
Ideal for multisite testing of analog and smart power devices requiring kelvin
Reduced site to site pitch concept enables high parallel test for power applications on strip-test and pick and place handler platforms
Excellent RF Performance with Low Cost of Ownership
cDragon pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.
By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
cDragon’s low profile and high bandwidth with low inductance makes it an ideal contacting solution for testing of mobile communications, RF switches, A/D converters, LNA’s, and PMIC devices. cDragon’s pins affinity to solder migration will ensure low and repeatable contact resistance.
cDragon can be used for testing any perimeter pad devices (QFN, DN, PLCC) and leaded packages (QFP, SO).
High Power Known Good Die Solution for Wide Bandgap Silicon Carbide and GaN High-Voltage and High-Current Applications
cGator Contactor is a Top and Bottom Contacting Solution for Power Known Good Dies (KGD).
Cohu´s Volta-Core Micro Cantilever Technology provides stable and low CRES for very challenging high-voltage and high-current requirements.
The gentle-touch feature reduces surface impacts to a minimum while providing a reliable contact force.
The Volta-Core Micro Cantilever Probe Head enables efficient heat dissipation from Top and Bottom surface of the Die under test.
Micro Cantilever enables smart stacking of pins to increase current carrying capability.
cHybrid Turret Kelvin Contactor
For leaded and leadless devices down to 0.3 mm x 0.6 mm
Compact multi-beam pin structure for high density system integration on turret handlers with side-by-side design for very small pad sizes.,
cHybrid Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multibeam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.
cHybrid Kelvin contactor with multibeam contact spring architecture delivers improved yield and long life which minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.
cPython Kelvin Contactor / Probe Head
High performance kelvin contact for high volume production test
cPython Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.
cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz. cPython Kelvin probes can land on 0.4 mm pitch targets, and their tip spacing is 90 µm to land on small targets. cPython probes are available with homogeneous tips to optimize performance.
cRacer Contactor / Probe Head
Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz
cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.
cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
ecoAmp Kelvin Contactor
Cantilever contactor for high power applications
ecoAmp Kelvin is a high power cantilever kelvin contactor with patented spring and tip design for optimum heat dissipation. This ensures best reliability, long spring life and high yield even under highest current and temperature requirements.
Proven cantilever technology for MCUs and ASICs
MiCon is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.
MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.
Kelvin test socket for high power plunge-to-board applications
nanoKelvin is a well-established cantilever kelvin contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.
xWave Contactor / Probe Head
Broadband Production Solution for cmWave and mmWave up to 100 GHz
The xWave contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication xWave contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.
Learn more about our Interface Solutions.