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Semiconductor ATE

Market Leader in RF Power Amplifier / Front-End Module Testing

Cohu has 40+ years semiconductor test expertise designing and manufacturing scalable automated test equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices. Our solutions provide:

  • Best-in-class RF measurement performance for Power Amplifier and Front-End Module test
  • Unique compact and multisite RF test solution for all connectivity standards
  • Test instrumentations for a wide range of modern automotive applications such as ADAS, CAN/LIN and Power
  • Best-in-class precision analog source and measurement technology
  • Flat Panel Display driver test capability available on a low-cost configurable SOC test platform
  • High precision DAC and ADC measurement instrumentation and expertise

Semiconductor automated test equipment (ATE) is used both for wafer level and device package testing. Our semiconductor ATE solutions consist of platforms focused primarily on the system on a chip (SOC) device market. Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.

Cohu Semiconductor ATE

Application Solutions

Automotive, Consumer, Flat Panel Display, Industrial & Medical, IoT, MCU, Mobility, Power Management, Wireless/RF

Diamondx Test System

Flexible, cost-optimized test solutions for the most challenging applications

Diamondx DxV Test System

Changes the rules of design through the production test

PAx Test System

Market leading Test System for high volume RF PA / FEM, 5G and mobility devices


Test solutions specifically designed for automotive, consumer, flat panel display, industrial and medical, IoT, MCU, mobility, power management and wireless/RF


Unison – the software that simplifies semiconductor test

Application Services

Semiconductor test expertise at your service

ATE Knowledge Center and eLearning

Access to knowledge resources 24/7