Cohu has 40+ years semiconductor test expertise designing and manufacturing scalable automated test equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices. Our portfolio of instrumentation and universal Automatic Test Equipment (ATE) platform best-in-class solutions enables faster time to yield.
Best-in-class RF measurement performance for PA/FEM, <4G, 5G, Wi-Fi 6/6E/7, and mmWave.
RF Connectivity Test
Unique compact and multisite RF test solution for all connectivity standards.
Source and Measure
Best-in-class precision analog source and measurement technology.
For a wide range of modern automotive applications such as ADAS, CAN/LIN, and power management devices for xEV.
Flat Panel Display
FPD driver test capability available on a low-cost, air-cooled universal test platform.
DAC and ADC
High precision DAC and ADC test measurement instrumentation and expertise
Diamondx Test System
Flexible, cost-optimized test solutions for the most challenging applications
Changes the rules of design through production test
Full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system design to be used in the engineering lab or office.