Semiconductor Tester Solutions for Internet of Things
Enabling a connected world.
Unique compact and multisite RF test solution for all connectivity standards.
Cohu Tester Experience
Diamondx Test System
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.
Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.
PAx Test System
Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices
PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.
PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PA’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.
High Speed Waveform Digitizer
High-Value Solution for Testing Digital and Mixed-Signal Devices
32 Channel Digital Instrument
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
Optimized Solution for LVDS Port and DDR Memory Port Test
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
Power Amplifier device power supply
5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7
Sequenced Waveform Generator (SWG)
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