• Banner

Semiconductor ATE Solutions for IoT

Enabling a connected world

 

Cohu IoT IoV Optoelectronic Market Solutions

Cohu ATE Experience

  • Unique compact and multisite RF test solution for all connectivity standards
  • Test solutions for very small, delicate semiconductors, sensors and optoelectronic devices
  • High multisite sensor testing

Applications

  • Sensors and MEMS
  • IoT endNodes
  • Low-cost Connectivity

Test System Solutions

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices

PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.

PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PA’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.

Instrumentation Solutions

High Speed Waveform Digitizer

  • Dual channel, 14 Bit, 105 MSPS waveform digitizer
  • Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance
  • Offers an analog bandwidth greater than 150 MHz

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

 

Highlights

  • High performance RF test capability
  • New levels of manufacturing test efficiencies

 Key Features

  • Configurable with 16 or 32 Universal RF ports per module with an optional port to pin expander, doubling the number of RF ports to 64 pins
  • 6 GHz RF modulated source and 8 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad site and octal site RF source with single and dual synthesizer respectively
  • Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements
  • Real time Dynamic Range Enhancer (DRE) per RF measure path
  • Compact footprint RF generators
  • Industry-leading source muxing flexibility
  • Latest RF Synthesizer technology
  • Cross-platform test system software: Unison
  • Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application

32 Channel Digital Instrument

  • Fully independent programming of timing and level on every channel
  • Synchronization signaling to/from other instruments
  • Read/Write memory for generating digital protocols used in RF front end applications
  • Multi-site programming model
  • Full pattern sequencing at 200 Mbps

General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

Power Amplifier device power supply

  • One measure FIFO per channel
  • 4 Channels per Board
  • Voltage: -2 V to +16 V
  • Current: 2 A per channel
  • 16 bit force/measure, parallel measure
  • Channels can be ganged for higher currents
  • 250 Ksps capture in 4096 memory

5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7

  • Only cost optimized ATE solution that covers sub-8.5 GHz with instrument extension to 18 GHz with high power
  • Best-in-class ATE EVM and modulation bandwidth with faster acquisition times across frequency and ranges
  • Single platform covering <4G, 5G sub-8.5 GHz, Wi-Fi 6/6E/7 and mmWave
  • Seamless On-site Field Upgradable
  • Significant increase in performance and throughput with minimal cost of change

Sequenced Waveform Generator (SWG)

  • Dual channel, 16 Bit, 250 MSPS sequential and arbitrary waveform generator
  • Sampler Clock Synthesizer can generate clock rates of 12.5 MHz to 400 MHz. Although the generator can only be closed to 250 MHz, the extra clocking range is available if needed for other test purposes
  • Offers digital frequency up conversion and sequencer capabilities

Expertise

Learn more about our Semiconductor ATE Solutions