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You are here: Home1 / Test Handlers2 / Pick and Place

Pick-and-Place Test Handlers



Thermal, vision and factory 4.0 automation options

Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets.

Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.

Cohu Delta Eclipse XT Pick and Place Test Handler

Eclipse

Configurable OSAT Friendly Pick-and-Place Handler
Eclipse delivers scalable performance for testing a wide range of semiconductors.

Visit to Read More about the Eclipse

Cohu MATRiX Pick and Place Test Handler

MATRiX

High Parallel Tri-Temp Pick-and-Place Handler
MATRiX handler has a highly-flexible test site configuration that is well suited for a wide range of test applications

Visit to Read More about the MATRiX

Cohu T-Core Active Thermal Control Test Handlers

Thermal

T-Core Active Thermal Control
Unique ATC technology that maximizes test yield.

Visit to Read More about T-Core Active Thermal Control

Cohu MT9510 Pick and Place Test Handler

MT9510 XP / x16

Tri-Temp Pick-and-Place Handler
Universal handler for packages such as QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC, PGA, LGA, MLP/MLF.

Visit to Read More about the MT9510

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  • Products
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        ▼
        • Eclipse
        • MATRiX
        • MT9510
      • Thermal
        ▼
        • T-Core Active Thermal Control
        • Temperature Chambers
      • Gravity
        ▼
        • MT9928
        • Rasco SO1000
        • Rasco SO2000
        • SH-5300
      • High Parallel Test
        ▼
        • FH-1200
        • InCarrier
        • MH-3300
        • NY32-LU
        • Rasco Jaguar
        • Sense+ Automation Platform
      • MEMS and Sensor Test
        ▼
        • Sense+ Automation Platform
        • Inertial Test
        • Magnetic Sensor Test
        • Microphone Test
        • Optical Sensor Test
        • Pressure Test
      • Turret Test and Scan
        ▼
        • Ismeca NY20
        • Ismeca NY32
        • Ismeca NY32W
    • Semiconductor Testers
      ▼
      • Application Solutions
      • EducATE Knowledge Center
      • Test Systems
        ▼
        • Diamondx
        • Diamondx DxV
        • PAx
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        • Wireless / RF Instrumentation
      • Software
    • Interface Solutions
      ▼
      • Key Test Requirement
      • Interface Technology
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      • Kita Advanced Spring Probes
      • ECT Industrial Contacts
    • Inspection and Metrology
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        • Ismeca NY32
      • WLCSP Inspection
        ▼
        • Neon
      • NV-Core Inspection System
        ▼
        • 3D Flex Vision System
        • Aquilae HR Sidewall Module
        • Aquilae Infrared Module
    • Data Analytics
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      • DI-Core Data Intelligence System
      • Tignis, a Cohu Analytics Solution
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