cViper™ Contactor / Probe Head

High Performance Probe Head for High Volume Production Test

cViper is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices.  Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.

  • Features

    • Low loop inductance and high bandwidth
    • Device pitch down to 100 µm
    • Variety of contact materials to optimize performance
    • Manual actuation of singulated devices

  • Benefits

    • Lab and volume production test
    • Singulated devices or wafer-level test
    • Low and stable contact resistance
    • Bandwidth up to 27 GHz
  • Package Type

    • WLCSP (singulated devices or wafer-level test)
    • Known-Good-Die
  • Applications

    • High End Digital
    • Mobility
    • Precision Analog and Sensors
    • RF