Probe standardized and simplification designed for high-volume power and RF applications, improving OEE.
High-Performance Standard Test Height Probes
Best-in-class common test head spring probe product line for semiconductor power and RF applications supporting pitches down to 0.15 mm and up to 0.8 mm. Hydra probe components are designed for high-volume manufacturing expected to withstand the production environment for hundreds of thousands of insertions/cycles with low contact resistance. Providing standardization with common test heights to standardize change kits and hardware.
Ability to mix and match power and RF Kelvin probes within the same semiconductor test socket housing enabling easy interchangeability.
Hydra can be combined with Cohu’s cRacer, ICON, or xWave test socket technology for optimized RF performance offers solutions for 5G mmWave FR2 up to 54+ GHz.
Features a robust solution for package plating from Matte Tin to NiPd.
- Higher carrying capacity
- Low cRES performance with long life expectancy
- Maximum compliance range for large array packages
With Hydra test socket, probe management is streamlined, with fewer probe part numbers to manage, in-stock availability, and short lead times.
Pitches 0.15 mm to 0.8 mm
500K Life Span for packaged devices
Temperature range -55 ̊C to +200 ̊C for Kelvin and -55 ̊C to +155 ̊C for standard.
Fewer probe part numbers to manage. Shorter lead times and in-stock availability.
Common test heights to standardize change kits and hardware.
3 Tip Styles
Three probe tip styles to select from Single-Point, 4-Point Crown, and Kelvin.
Grid array packages: BGA, LGA, WLCSP. Leadless packages: QFN, QFP, SO.