Diamondx Instrumentation

AT1x
Automotive Test Composite Pin

• Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
• Reduced load board complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resources to DUT pin connections
• Transient detect capability to capture perturbations at the device in program development or production test

VI1x
Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices

• Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
• A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
• A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument

DPS1x
High Performance Device Power Supply

• Multisite testing of multi-core application processors and other high current, low voltage devices
• Drop-in replacement for DPS16 with enhanced capabilities

DPS16

16-Channel Device Power Supply

• Continuous voltage source
• Voltage and current measurement

FPVIx
High Voltage, High Current Floating Programmable Power Supply

• Fast throughput with high power pulsed mode operation
• Transient detect capability to capture perturbations at the device in program development, or production test
• Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
• Expert mode to maximize energy efficiency of the instrument

HDVI
High Density Voltage Current Instrument for Massive Multisite Test

• Highest V/I pin density in the industry
• Voltage/current supply (VIS) mode
• Precision analog source (PAS) mode
• Flexible triggering options
• External input matrix

HPVIx
High Power Voltage/Current Programmable Power Source

• Fast throughput with high power pulsed mode operation
• Transient detect capability to capture perturbations at the device in program development, or production test
• Reduced loadboard complexity using the SmartMux for high voltage and current signal routing

PD2x
Test Solution for Ultra High Definition Display Driver ICs

• Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
• Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
• Extended range selection
• 128k capture memory per channel
• Industrial and automotive display drivers

PMVIx
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

• Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps

VIS16
Precision Voltage/Current Source and Measurement with Advanced Features

• V/I source mode
• AWG and digitizer functions
• Time measurement
• Differential voltage measurement
• Timers, triggers and gates
• Alarms

VI1x
Precision Voltage/Current Source and Measurement with Advanced Features

• V/I source mode
• AWG and digitizer functions
• Time measurement
• Differential voltage measurement
• Timers, triggers and gates
• Alarms

DPIN-96
High-Value Solution for Testing Digital and Mixed-Signal Devices

• Flexible timing
• Reconfigurable pattern memory
• Deep capture memory
• High-precision PMU
• Built-in time measurement
• Super voltage
• Comprehensive software tools

GX1x
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

• Flexible pattern memory allocations
• Multiple pattern generation
• Transmit and receive of digitized waveforms
• Pattern synchronization and control of DC and AC analog test instruments

MP1x
Optimized Solution for LVDS Port and DDR Memory Port Test

• Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
• Supporting built-in memory protocol support
• Same cycle match capability to support for data latency of up to 8 cycles

PD1x / PD2x
Test Solution for Ultra High Definition Display Driver ICs

• Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
• Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
• Extended range selection
• 128k capture memory per channel
• Industrial and automotive display drivers

DIGHB
Hummingbird Digitizer

• Four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer
• Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance
• Offers an analog bandwidth of up to 800 MHz
• DIGHB is supported on PAx and Diamondx

Multiwave
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

• Wide bandwidth analog source
• Wide bandwidth analog capture
• Flexible triggering
• High-precision PMU
• Protected I/O channels
• Simpler test boards
• Mixed-signal software support

DCTMx
Precision Data Converter Test Module

• Precision linearity to 1 ppm
• Single-ended, differential, and pseudo-differential connection
• Testing ADCs and DACs, and class-D amplifiers with a single instrument

DragonRF

Industry leading RF source and receive with scalar and vector measure

• Extensive suite of capabilities designed to provide the lowest cost of test without any compromise in RF test performance
• Innovative flexible architecture enables scalable configurations with optimal return on investment without trade-off in test coverage or test time
• Configurable with 16 or 32 Vector RF ports
• 6 GHz RF modulated source and 8 GHz RF measure
• <1 ms RF settling time on level and frequency change
• Quad-site and octal-site RF source with single and dual synthesizer respectively
• Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements.
• Each receiver is connected to a digitizer with 14 bit @ 105 Msps
• Full modulation capability using SWG instrument providing 16 bits @ 250 Msps
• Swept S-parameter capability
• Servo loop tracking
• Real time Dynamic Range Enhancement

Raven

Ku-Band RF test solution for next generation mobility

• Extensive capabilities to provide high performance RF test capabilities with maximum return on investment
• Fully compatible software with DragonRF, enabling rapid deployment of test development IP leveraged from existing programs
• Scalable configuration which extends RF performance into satellite communications band
• Designed to coexist with DragonRF to ensure maximum test flexibility on a single test system
• Quickly deployed, Raven extends the performance of the system on existing infrastructure to ensure protection of your investment

Nighthawk CT

Ultra compact RF instrument

• Comprehensive set of RF features at a fraction of the price of traditional RF ATE systems
• Four analyzers ensure parallel testing
• Low operating cost
• Portable between Diamondx and Diamond10 test systems

HSI1x
Scalable, Cost-Efficient Solution for High Performance SerDes Test

• Physical layer testing with built in PRBS BERT TX/RX
• BIST/DFT testing using high bandwidth drive/compare memory
• Protocol level and mixed-signal testing using deep send pattern memory

HSI2x
High Speed Solution for SerDes/LVDS/MIPI Interfaces

• Physical layer testing with built in PRBS BERT TX/RX
• BIST/DFT testing using high bandwidth drive/compare memory
• Protocol level and mixed-signal testing using deep send pattern memory

HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

• Physical layer testing with built in PRBS BERT TX/RX
• BIST/DFT testing using high bandwidth drive/compare memory
• Protocol level testing using deep send and receive pattern memories

ATMPx
Analog Time Measurement Processor

• Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
• Reduced loadboard complexity using the SmartMux for high voltage timing measurements