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Diamondx Instrumentation

A variety of instruments make the Diamondx suitable for testing todays Wireless, Mobility, SOC, Flat Panel Display drivers, Power Management, and Microcontrollers for the Automotive, Mobility, IoT/IoV/Optoelectronics, Data Center, Cloud and AI, Industrial and Medical, and Consumer markets.

Automotive Instrumentation

AT1x
Automotive Test Composite Pin

  • Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
  • Reduced load board complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resources to DUT pin connections
  • Transient detect capability to capture perturbations at the device in program development or production test

VI1x
Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices

  • Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
  • A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
  • A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument

DC and Power Instrumentation

DPS1x
High Performance Device Power Supply

  • Multisite testing of multi-core application processors and other high current, low voltage devices
  • Drop-in replacement for DPS16 with enhanced capabilities

DPS16

16-Channel Device Power Supply

  • Continuous voltage source
  • Voltage and current measurement

FPVIx
High Voltage, High Current Floating Programmable Power Supply

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
  • Expert mode to maximize energy efficiency of the instrument

HDVI
High Density Voltage Current Instrument for Massive Multisite Test

  • Highest V/I pin density in the industry
  • Voltage/current supply (VIS) mode
  • Precision analog source (PAS) mode
  • Flexible triggering options
  • External input matrix

HPVIx
High Power Voltage/Current Programmable Power Source

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing

PD2x
Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

PMVIx
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

  • Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps

VIS16
Precision Voltage/Current Source and Measurement with Advanced Features

  • V/I source mode
  • AWG and digitizer functions
  • Time measurement
  • Differential voltage measurement
  • Timers, triggers and gates
  • Alarms

VI1x
Precision Voltage/Current Source and Measurement with Advanced Features

  • V/I source mode
  • AWG and digitizer functions
  • Time measurement
  • Differential voltage measurement
  • Timers, triggers and gates
  • Alarms

Digital Instrumentation

DPIN-96
High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

GX1x
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

MP1x
Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

Display Driver/Flat Panel Instrumentation

PD1x / PD2x
Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

Mixed Signal and DSP Instrumentation

DIGHB
Hummingbird Digitizer

  • Four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer
  • Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance
  • Offers an analog bandwidth of up to 800 MHz
  • DIGHB is supported on PAx and Diamondx

Multiwave
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

DCTMx
Precision Data Converter Test Module

  • Precision linearity to 1 ppm
  • Single-ended, differential, and pseudo-differential connection
  • Testing ADCs and DACs, and class-D amplifiers with a single instrument

RF Instrumentation

DragonRF

Industry leading RF source and receive with scalar and vector measure

  • Extensive suite of capabilities designed to provide the lowest cost of test without any compromise in RF test performance
  • Innovative flexible architecture enables scalable configurations with optimal return on investment without trade-off in test coverage or test time
  • Configurable with 16 or 32 Vector RF ports
  • 6 GHz RF modulated source and 8 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad-site and octal-site RF source with single and dual synthesizer respectively
  • Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements.
  • Each receiver is connected to a digitizer with 14 bit @ 105 Msps
  • Full modulation capability using SWG instrument providing 16 bits @ 250 Msps
  • Swept S-parameter capability
  • Servo loop tracking
  • Real time Dynamic Range Enhancement

Raven

Ku-Band RF test solution for next generation mobility

  • Extensive capabilities to provide high performance RF test capabilities with maximum return on investment
  • Fully compatible software with DragonRF, enabling rapid deployment of test development IP leveraged from existing programs
  • Scalable configuration which extends RF performance into satellite communications band
  • Designed to coexist with DragonRF to ensure maximum test flexibility on a single test system
  • Quickly deployed, Raven extends the performance of the system on existing infrastructure to ensure protection of your investment

Nighthawk CT

Ultra compact RF instrument

  • Comprehensive set of RF features at a fraction of the price of traditional RF ATE systems
  • Four analyzers ensure parallel testing
  • Low operating cost
  • Portable between Diamondx and Diamond10 test systems

SerDes Instrumentation

HSI1x
Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

HSI2x
High Speed Solution for SerDes/LVDS/MIPI Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level testing using deep send and receive pattern memories

Time Measurement Instrumentation

ATMPx
Analog Time Measurement Processor

  • Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
  • Reduced loadboard complexity using the SmartMux for high voltage timing measurements
Cohu Semiconductor ATE

Instrumentation by Name

  • ATMPx – Analog Time Measurement Processor
  • AT1x – Automotive Test Composite Pin
  • DCTMx- Precision Data Converter Test Module
  • DIGHB – Hummingbird Digitizer
  • DPIN-96 – High-Value Solution for Testing Digital and Mixed-Signal Devices
  • DPS16  – Device Power Supply
  • DPS1x – High Performance Device Power Supply
  • Dragon RF – RF Test Solution for the Complete Spectrum of Connectivity and Mobility Standards
  • FPVIx – High Voltage, High Current Floating Programmable Power Supply
  • GX1x – General-Purpose Digital Instrument for Digital ASSP, Analog ASSP and MCU Digital Testing
  • HDVI – High Density Voltage/Current Floating Programmable Power Supply
  • HPVIx – High Power Voltage/Current Programmable Power Source
  • HSI1x – Scalable, Cost-Efficient Solution for High Performance SerDes Test
  • HSI2x – High Speed Solution for SerDes/LVDS/MIPI Interfaces
  • HSIO – 8 Lane SerDes Instrument for Testing of High Speed Serial Interfaces
  • MP1x – Optimized Solution for LVDS Port and DDR Memory Port Test
  • Multi-Wave – Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
  • Nighthawk CT – Ultra Compact RF Instrument
  • PD1x / PD2x – Test Solution for Ultra High Definition Display Driver ICs
  • PMVIx – Voltage/Current Source for Mobile Power Management, ASSP, Automotive and MCU ICs
  • Raven – Ku-Band RF test solution for next generation mobility
  • VIS16 – Precision Voltage/Current Source and Measurement with Advanced Features
  • VI1x – Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices