Interface Solutions for Precision Analog and Sensors
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Kelvin contact solutions that scale to high power and small footprint to enable high test site density. Reliable low force contacting products.
Device Requirements
- High bandwidth
- Low capacitance
- Low inductance
- Low noise
- Low, repeatable resistance
Contactor Requirements
- Low cost of ownership
- Component placement close to DUT on test board
- Low and stable contact resistance
- Long run times between cleanings
- Wide temperature range
Applications
- Amplifiers, comparators
- Line drivers, current sourcing
- Power management, voltage references
- Sensors
- Signal conditioning, PLLs
Test Contactor (Socket) / Probe Head Solutions
cCompact Contactor
Ideal for multisite testing of analog and smart power devices requiring kelvin
Reduced site to site pitch concept enables high parallel test for power applications on strip-test and pick and place handler platforms
cCruiser Contactor
Providing Exceptional Lifetime for Discrete Contacting
cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.
cCruiser is the versatile solution for testing small discrete ICs. Its side-by-side Kelvin design is optimized for tri-temp capable insulation layer with extended Automotive temperature range -60°C to + 175°C. Contact socket is G-Pin footprint compatible with a contact spring wear out zone. Featuring conventional onboard socket contact mounting and 80 mΩ low and stable contact resistance. Raw Springs and cGold plating options available, as well as Thebe, our brand new, improved conductive material plating option that has >50% lower resistance.
cPython Kelvin Contactor / Probe Head
High performance kelvin contact for high volume production test
cPython Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.
cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz. cPython Kelvin probes can land on 0.4 mm pitch targets, and their tip spacing is 90 µm to land on small targets. cPython probes are available with homogeneous tips to optimize performance.
cViper Probe Head
High Performance Probe Head for High Volume Production Test
cViper is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
ecoAmp Kelvin Contactor
Cantilever contactor for high power applications
ecoAmp Kelvin is a high power cantilever kelvin contactor with patented spring and tip design for optimum heat dissipation. This ensures best reliability, long spring life and high yield even under highest current and temperature requirements.
E-Series Spring Probe Contactors
Custom Probes and Test Contactor Solutions up to 60 GHz
Our E-Series® probes offer a comprehensive portfolio designed for versatile testing applications—from bare boards to surface mount assemblies and more. Whether you need off-the-shelf options or fully customized solutions, we deliver performance, reliability, and value.
Providing test probe solutions, probe customization services and failure analysis capability are part of our core competencies.
Gemini Kelvin Contactor / Probe Head
Industry preferred high performance, high value, low cost true kelvin QuadTech contacting solution
Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
At 3.22 mm test height, the Gemini Kelvin is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The DUT side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.
Hydra Contactor / Probe Head
Common Test Height Probe Product Line.
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface. Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design. With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
nanoKelvin Contactor
Kelvin test socket for high power plunge-to-board applications
nanoKelvin is a well-established cantilever kelvin contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.
ULTRA-S Contactor
Durable, Long Lifespan, Higher Test Yield.
The ULTRA®-S cantilever spring contactor is engineered for high yield and consistent performance in the most demanding environments. Unlike traditional elastomer-based interfaces, ULTRA-S eliminates performance degradation caused by compression set, temperature, and humidity exposure.
xWave Contactor / Probe Head
Broadband Production Solution for cmWave and mmWave up to 100 GHz
The xWave contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication xWave contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.
Expertise
Learn more about our Interface Solutions.
