Interface Solutions for Precision Analog and Sensors
Enabling a connected world.
Contact Sales
Complete our contact form.
Kelvin contact solutions that scale to high power and small footprint to enable high test site density. Reliable low force contacting products.
Device Requirements
- High bandwidth
- Low capacitance
- Low inductance
- Low noise
- Low, repeatable resistance
Contactor Requirements
- Low cost of ownership
- Component placement close to DUT on test board
- Low and stable contact resistance
- Long run times between cleanings
- Wide temperature range
Applications
- Amplifiers, comparators
- Line drivers, current sourcing
- Power management, voltage references
- Sensors
- Signal conditioning, PLLs
Test Contactor (Socket) / Probe Head Solutions
HYDRA Series Contactor / Probe Head
Common Test Height Probe Product Line.
Engineered for excellence and efficiency, HYDRA™ Series spring probe series offers precision, reliability, and standardized semiconductor test interface. Designed to be best-in-class at a competitive price point, HYDRA is optimized to maximize your operational efficiency. HYDRA is built to withstand demanding high-volume manufacturing test environments with its robust and durable design. With a common test-height, HYDRA offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, HYDRA streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
HYDRA xW Contactor / Probe Head
Broadband Production Solution for cmWave and mmWave up to 100 GHz
The HYDRA xW contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the HYDRA xW contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication HYDRA xW contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.
MAXOR cCompact Contactor
Ideal for multisite testing of analog and smart power devices requiring kelvin
Reduced site to site pitch concept enables high parallel test for power applications on strip-test and pick and place handler platforms
MAXOR cCruiser Contactor
Providing Exceptional Lifetime for Discrete Contacting
MAXOR cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. MAXOR cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.
MAXOR cCruiser is the versatile solution for testing small discrete ICs. Its side-by-side Kelvin design is optimized for tri-temp capable insulation layer with extended Automotive temperature range -60°C to + 175°C. Contact socket is G-Pin footprint compatible with a contact spring wear out zone. Featuring conventional onboard socket contact mounting and 80 mΩ low and stable contact resistance. Raw Springs and cGold plating options available, as well as Thebe, our brand new, improved conductive material plating option that has >50% lower resistance.
MAXOR ecoAmp Kelvin Contactor
Cantilever contactor for high power applications
MAXOR ecoAmp Kelvin is a high power cantilever kelvin contactor with patented spring and tip design for optimum heat dissipation. This ensures best reliability, long spring life and high yield even under highest current and temperature requirements.
ULTRA-S Contactor
Durable, Long Lifespan, Higher Test Yield.
The ULTRA®-S cantilever spring contactor is engineered for high yield and consistent performance in the most demanding environments. Unlike traditional elastomer-based interfaces, ULTRA-S eliminates performance degradation caused by compression set, temperature, and humidity exposure.
Expertise
Learn more about our Interface Solutions.
