Advanced inspection and metrology system providing true infrared imaging for subsurface crack detection on silicon and 3D metrology capability for precision measurements maximizing inspection yield. Artificial Intelligence algorithms enable pattern recognition and precise defect classification.
Unique Inspection Technology Across Cohu Handlers and Inspection
NV-CoreTM Inspection System is Cohu’s unique inspection technology, enabling advanced inspection capabilities across Cohu’s handler and inspection & metrology portfolio.
NV-Core’s latest advanced inspection technologies include innovative solutions such as 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection for sub-surface defect detection.
In addition to device quality inspection, by mastering the “all-in-one” solution, Cohu can offer unique capabilities for handler’s diagnostics and alignments, that enable the highest productivity performance.
- 2D and 3D Lead / Pad / Ball / Pin inspections
- Marking (OCR / OCR), presence and orientation inspections
- LED lens dome inspection (shape, scratches, bubbles…)
- Top / bottom / side crack detection
- Traceability (Bar and Matrix codes)
- Advanced surface inspection and post sealing quality inspection
NV-Core Options
- Aquilae HR Sidewall: Micro-scale visible defect inspection down to 5 µm
- Aquilae Infrared: Inner cracks detection on silicon devices
- 3D Flex® Vision: True 3D inspection for Balls/Bumps
Handler and Inspection Availability
- Eclipse pick-and-place
- MATRiX pick-and-place
- Ismeca NY20 turret test and scan and package inspection
- Ismeca NY32 turret test and scan and package inspection
- Ismeca NY32W KGD and LED
- Neon Inspection
- Krypton Inspection
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