Cantilever Test Contactor (Socket) / Probe Head Solutions
Highest Performance at Best Cost of Test for Microcontroller and Analog
The durable one piece design combined with the proven self-cleaning wipe enable a low and stable contact resistance, a high current carrying capability and an extended temperature range. The cantilever contactors are developed and optimized to reduce cost of test. This is the result of a boosted first pass yield, enhanced production reliability, improved OEE and extended maintenance intervals. Moreover testing at full specification values like high current and tri-temp with extreme temperature ranges are no longer a limitation.