High-Performance Strip Handler

The Jaguar strip test handler is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for power and sensor devices.

The system features a precise, forceless contacting solution to ensure integrity of delicate bare die and ceramic substrates.

The handler is designed to operate stand alone or in-line with other product equipment, testing each layer on a multi-die 3D stack process.  Additionally, Jaguar can be configured for high parallelism full flux or thermography test of lead-frame and tile LEDs, or integrated with various MEMS modules for cost-effective testing of magnetic, pressure, acoustic and optical sensors.

Wide package range; Leaded and leadless. Ability to handle all common types of strip and different type of strip input and output.

Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.