Industrial and Medical Expertise
Delivering solutions that automate the industry.
Delivering solutions that automate the industry.
Cohu has a long history of supporting industrial and medical customers and are the leading providing of Industry 4.0 ready solutions for semiconductor test and inspection & metrology.
Machinery
General Medical ICs
Smart Grids
Handlers and interface solutions with best-in-class thermal accuracy for high parallelism applications addressing the full range of automotive temperature testing.
Unique T-Core Active Thermal Control (ATC) technology enables the testing of very high-power processors.
Kelvin contact solutions that scale to high power and small footprint to enable high test site density, as well as best-in-class Cost of Test by long lifespan and less cleaning efforts.
High precision DAC and ADC measurement instrumentation and expertise.
Unique architecture to isolate sensors under test from environmental influences, including vibration and noise, enables handling of delicate devices at very high speeds.
Leading provider of I4.0 ready solutions for semiconductor test and inspection & metrology.
MT9928 – This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.
Rasco SO1000 – The gravity handler with the largest installed base. Due to mature design and high reliability, it provides excellent cost of test. Highly flexible due to a broad range of device kits that can be combined with various Sensor and MEMS applications.
Rasco SO2000 – Modular designed gravity handler with various input and output possibilities. Additional ambient chamber for dual temp option available. SO2000 can handle the smallest possible packages for Gravity and provides a broad range of Sensor and MEMS applications.
Jaguar – designed for high-volume production testing of ICs on a strip format or in device carrier.
MCT SH-5300 – designed for testing advanced semiconductor packages, LED’s MEMS sensors, and traditional ICs.
NY32-LU – is a highly efficient and flexible loading/unloading of InCarrier, including vision inspection and final packaging. Controlled and sensitive device handling with Cohu’s high precision turret and enhanced vision capabilities with NV-Core Inspection System. With our scalable concept, one system could be used as a Loader and Unloader or depending on the desired output, a dedicated Loading or Unloading system can be configured and optimized.
MCT MH-3300 – designed for marketing of 2DiD codes on the lead frame in support of strip testing, marking of reject devices, and final package marketing in strip test or assembly operations.
MCT FH-1200 – designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages.
We offer innovative concepts for the automotive MEMS market; magnetic, inertial, pressure, microphone, optical, humidity and gas sensor test. Cohu MEMS solutions combine the advantages of well-established and production-proven tri-temp test handling equipment with innovative concepts to meet the special requirements of the MEMS market.
Sense+ – next-generation MEMS sensor test platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspection, small delicate sensors. Fully configured Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
Delta Eclipse – is part of the key customers’ modular structured smart factory, allowing them to be more efficient. The new front-end tray automation and micron accurate designs provide a new level of performance and capabilities to fuel sales and market position. In production, the XTA fleet’s performance is above the goal set by customers. It boasts more than 42,000 mean contact between jams (MCBJ) and runs 3×3 millimeter devices.
Delta MATRiX – handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
MT9510 XP / MT9510 x16 is a universal pick and place handler for packages such as QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC, PGA, LGA, MLP/MLF. The MT9510 XP ensures a fully reliable test of packages in cold, hot or ambient test conditions. Based on its outstanding temperature performance, the MT9510 XP provides solutions for managing medium power dissipation in a cost-efficient way. The MT9510 x16 continues the MT9510 XP features in terms of reliability, temperature performance and advanced options.
Ismeca NY20 – 20-position turret platform for semiconductors test, inspection and packaging, providing the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity. The NY20 also integrates with Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with a high-resolution camera.
Ismeca NY32 – 32-position turret platform for semiconductors test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity. The NY32 also integrates Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with a high-resolution camera.
Ismeca NY32W – 32-position turret platform for semiconductors on film-frame wafer media, providing the highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity. The NY32W also integrates Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection technology for sub-surface defect detection.
Neon – can handle fragile wafer level chip scale products at high speed, maintaining high operational efficiency while inspecting small devices down to 0.4 x 0.2 mm in size. It features extended process integration capabilities and can be configured with infrared and visual micro-scale defect inspection modules. It is also equipped with an external loader unloader to integrate with factory robots for customers adopting Industry 4.0 initiatives.
Ismeca NY20 – 20-position turret platform for semiconductors test, inspection and packaging, providing the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity. The NY20 also integrates with Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with a high-resolution camera.
Ismeca NY32 – 32-position turret platform for semiconductors test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity. The NY32 also integrates Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with a high-resolution camera.
NV-Core – is Cohu’s unique vision technology, enabling advanced inspection capabilities across Cohu’s handler portfolio. NV-Core latest advance inspection technologies include innovative solution such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection for sub-surface defect detection. In addition to device quality inspection, by mastering the “all-in-one” solution, Cohu can offer unique capabilities for handler’s diagnostics and alignments, that enable the highest productivity performance.
Diamondx – test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Diamondx DxV – provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions no mainframe, separate workstation, or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop.
cCompact Kelvin Contactor – multisite testing of Analog and Smart Power Devices requiring Kelvin test. Reduced site-to-site pitch concept enables high parallel test for power applications on strip-test and pick and place handler platforms.
ecoAmp Kelvin Cantilever Contactor – high power contactor with patented spring and tip design for optimum heat dissipation. This ensures the best reliability, long spring life and high yield even under the highest current and temperature requirements.
nanoKelvin Cantilever Kelvin Contactor – well-established contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.
cHybrid Turret Kelvin Contactor – compact multi-beam pin structure for high-density system integration on Turret Handlers with Side-by-side design for very small pad sizes.
MiCon Cantilever Contactor – spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups.
cDragon Cantilever Contactor – excellent RF performance with low cost of ownership. cDragon pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.
cPython Kelvin Contactor/Probe Head – provides superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors. cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions.
xWave Contactor/Probe Head – utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
Atlas Contactor/Probe Head – offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
cBoa Contactors/Probe Head – the solution for contacting high frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.
cViper Probe Head – ultra-fine-pitch probe head for RF and high speed digital WLCSP and Known-Good-Die applications are ideal for lab and large volume production test of precision analog, RF, sensors and mobility devices.
cDragon Spring Probe Contactor – excellent RF performance with low cost of ownership. cDragon pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.
Gemini Kelvin Contactor/Probe Head – provide a first-rate solution that effortlessly makes reliable, true kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
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