• Banner

Industrial and Medical Expertise

Delivering solutions that automates the industry

Cohu Industrial Medical Market Test Solutions

Cohu Advantage

  • Leading provider of Industry 4.0 ready solutions for semiconductor test and inspection
  • Wide range of high voltage and high current contactors
  • Broad portfolio of MEMS sensors test, offering a complete Test Solution
  • High precision DAC and ADC measurement instrumentation and expertise

Applications

Growth in sensors, processors, safety and factory communications:

  • Energy management
  • General medical application ICs
  • Remote security
  • Smart grids

Test Handler Solutions

Gravity

MT9928

High Speed Gravity Handler

This well-established test handler provides field proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.

Rasco SO1000

Tube-to-Tube Gravity Handler

The gravity handler with the largest installed base. Due to mature design and high reliability it provides excellent cost of test. Highly flexible due to a broad range of device kits existing that can be combined with various Sensor and MEMS applications.

Rasco SO2000

Gravity Handler for Smallest Package

Modular designed gravity handler with various input and output possibilities. Additional ambient chamber for dual temp option available. SO2000 can handle smallest possible packages for Gravity and provides a broad range of Sensor and MEMS applications.

High Parallel Test

PANTHER Power

All-in-One Test and Inspection System for small package ICs

PANTHER Power enables higher production yield with integrated test and inspection cell with high parallel tri temp testing for small leadless packages, QFN / DFN .

It uses a chamber-less thermal technology, with six soaking stations. Coupled to a Cohu thermo pre-conditioned contactor, it guarantees a high stability in temperature at full range, from -45°C to +155°C.

PANTHER Power offers the most reliable testing cell for small devices at high speed with unlimited test parallelism.

PANTHER WLCSP

High Performance Post Singulated Test

PANTHER WLCSP is a breakthrough technology in post singulation testing. It provides the lowest cost of test for high volume QA and or customer return testing for singulated WLCSP, under real probing condition with direct docking at high parallelism and with 100% touch down efficiency.

PANTHER WLCSP guarantees 100% output quality with post singulation test and inspection with Micro scale defect detection.

Rasco Jaguar

High Performance Strip Handler

Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.


Pick and Place

Delta Eclipse XT

Highly Configurable Scalable Pick and Place Handler

Eclipse XT delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high performance mobile processors. The Eclipse XT is a high speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 units per hour.

Featuring Cohu’s proprietary T-Core thermal controller and a variety of cooling systems in order to provide precise, multi-site temperature management of power dissipative ICs, optimizing test yield of next generation IC’s. It also enables both IDM and Fabless customers to test high-end processors used in augmented virtual reality and deep-learning applications, giving continuity to Cohu’s leadership in advanced thermal test. Eclipse XT offers flexibility for both OSATs, IDM and Fabless customers with its wide market coverage through field configurability.

*device type dependent

Delta Eclipse XTA

Final Test System Lights Out Factory

The Eclipse XTA combines the essence of the Eclipse XT platform with Industry 4.0 factory automation—the current trend in automation and data exchange in manufacturing technologies. The Eclipse XTA is part of the key customers’ modular structured smart factory, allowing them to be more efficient. The new front-end tray automation and micron accurate designs provide a new level of performance and capabilities to fuel sales and market position. In production, the XTA fleet’s performance is above the goal set by customers. It boasts more than 42,000 mean contact between jams (MCBJ) and runs 3×3 millimeter devices.

Delta MATRiX

High-Performance, Configurable Pick and Place Handler

The MATRiX handler has a highly-flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.

MT9510

Tri-Temp Pick and Place Handler

The MT9510 XP / MT9510 x16 is a universal pick and place handler for packages such as QFP, BGA, Micro-BGA, CSP, TSSOP, PLCC,  PGA, LGA, MLP/MLF.

The MT9510 XP ensure fully reliable test of packages in cold, hot or ambient test conditions. Based on its outstanding temperature performance, the MT9510 XP provides solutions for managing medium power dissipation in a cost-efficient way.

The MT9510 x16 continues the MT9510 XP features in terms of reliability, temperature performance and advanced options.

Sensors and MEMS Test

Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling

Cohu MEMS solutions combine the advantages of well established and production proven tri-temp test handling equipment with innovative concepts to meet the special requirements of the MEMS market.

The modular design concept allows greatest flexibility for our customers as it allows ease of conversion between stimulus types. This flexibility and modularity provides the customers with the advantage of being able to react fast to the market changes and provides the best return on investment.

Cohu MEMS modules are available for a variety of sensor test applications, for singulated devices in various input media and also the unique and cost-efficient strip test in carriers, allowing the highest test parallelism in the market, and thus reducing the customers cost of test.

System Level Test

Solstice

System Level Test Burn-in Solution

High volume System-Level Test that is affordable for long test times. Parallelism up to 396 DUTs to achieve a throughput of up to 5,000 UPH. Combine this throughput with a small factory floor footprint to achieve the industry’s lowest cost of system-level test.

Turret Test and Scan

Ismeca NY20

Highest Throughput for Fragile Devices

20-position turret platform for semiconductors test, inspection and packaging, providing the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.

The NY20 also integrates with Cohu’s latest advance inspection technologies such as, 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with high resolution camera.

Ismeca NY32

Highest Demanding Finishing Processes

32-position turret platform for semiconductors test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features that enables extended autonomous operation and productivity.

The NY32 also integrates Cohu’s latest advance inspection technologies such as, 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with high resolution camera.

Ismeca NY32W

Highest Inspection Yield for Wafer Level Chip Scale Packages and Bare Dies

32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as Intelligent Features that enables extended autonomous operation and productivity.

The NY32W also integrates Cohu’s latest advanced inspection technologies such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection technology for sub-surface defect detection.

Inspection Solutions

WLCSP Inspection

Neon

Market Leading Inspection Yield with Uncompromised Throughput

Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in mobility and consumer applications.

Neon can handle fragile wafer level chip scale products at high speed, maintaining high operational efficiency while inspecting small devices down to 0.4 x 0.2 mm in size. It features extended process integration capabilities and can be configured with infrared and visual micro-scale defect inspection modules. It is also equipped with an external loader unloader to integrate with factory robots for customers adopting Industry 4.0 initiatives.

Neon  is designed to provide our customers with the best price/performance ratio in the industry, targeting semiconductors used in handset and small consumer electronics applications for high volume die sort needs.

Ismeca NY32W

Highest Inspection Yield for Wafer Level Chip Scale Packages and Bare Dies

32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enables extended autonomous operation and productivity. The NY32W also integrates Cohu’s latest advanced inspection technologies such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection technology for sub-surface defect detection.

NVcore Vision System

NVCore

Inspection to serve overall machine performance

NVcore is Cohu’s unique vision technology, enabling Advanced Inspection capabilities across Cohu’s handler portfolio.

NVcore latest Advance Inspection technologies include innovative solution such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection for sub-surface defect detection.

In addition to device quality inspection, by mastering the “all-in-one” solution, Cohu can offer unique capabilities for handler’s diagnostics and alignments, that enable the highest productivity performance.

Semiconductor ATE Solutions

Test Systems

Diamondx

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

DxV

Changes the Rules of Design Through to Production Test

he DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop

ASL1000

Ideal for cost-sensitive analog, linear & discrete devices

ASL1000 Test System provides industry leading value by delivering a high throughput yet low-cost solution, both from a cost of test and cost of ownership perspective. With its multisite capabilities, fast test times, and low cost of ownership, the ASL platform is the best in class solution for analog, linear and discrete market. Its wide range of low and high-power VIs together with the digital and time measurement capabilities provide a comprehensive test solution for cost sensitive linear and power management devices.

ASLx

Next Generation Low-Cost Analog Test System for power management and linear markets

Designed for the power management and linear markets, the ASLx provides infrastructure advancements extending the capabilities of the ASL platform, providing power, flexibility and cost conscious options while preserving the overall value based principles of the ASL platform.

MX

40 Instrument Slots, up to 512 Digital Pins

Instrumentation

Cohu has a number of ATE instruments focused on Industrial and Medical market

Test Cell Solutions

MEMS Test Cell

Pre-validated Test Cells delivering fast ramp to production yield and throughput

Cohu is the only company with the expertise on the entire test cell and inspection and is recognized for its industry-leading suite of flexible and cost-effective MEMS test cell offerings. We work in close cooperation with our customers and leverage the cross functional expertise of Cohu’s product teams; semiconductor ATE, test handler and interface solutions.

Cohu provides a full pre-validated service within our facilities, to ensure that start up time at the customer site is minimized and target production yield and throughput are achieved in the fastest possible time.

Cohu has delivered more than 20 complete MEMS test cells to IDMs and OSATs in Asia, Europe and North America to address next-generation device test requirements and supplement existing production capacity.

Test Contactor / Probe Head Solutions

Atlas Contactor / Probe Head

Optimal performance for large I/O count devices and high end digital test

QuadTech probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance

Atlas offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology.  The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.

The cruciform tip provides increased tip rigidity with a much greater immunity to breakage. The advantages for the customer include increased run times between contactor cleaning, increased probe life, increased yield, and reduced system down time for contactor maintenance.

cBoa Contactor / Probe Head

Uncompromised performance radial probe for the toughest test conditions

cBoa contactors and probe heads are the solution for contacting high frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogenous DUT side plunger provides longer run times between cleaning and increased probe life.

The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C. With a bandwidth up to 27 GHz, cBoa can be used to test some of the highest frequency devices.

The enhanced compliance window accommodates package stack height tolerances well.

cCompact Contactor

Ideal for multisite testing of analog and smart power devices requiring kelvin test

Reduced site to site pitch concept enables high parallel test for power applications on strip-test and pick and place handler platforms

cDragon Contactor

Excellent RF performance and reliability for tri-temp production test with low cost of ownership

cDragon pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.

By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.

cDragon’s low profile and high bandwidth with low inductance makes it an ideal contacting solution for testing of mobile communications, RF switches, A/D converters, LNA’s, and PMIC devices. cDragon’s pins affinity to solder migration will ensure low and repeatable contact resistance.

cDragon can be used for testing any perimeter pad devices (QFN, DFN) and leaded packages (QFP, SO).

cHybrid Turret Kelvin Contactor

For leaded and leadless devices down to 0.3 mm x 0.6 mm

Compact multi-beam pin structure for high density system integration on Turret Handlers with Side-by-side design for very small pad sizes

cPython Kelvin Contactor / Probe Head

High Performance kelvin contact for high volume production test

cPython Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings.  This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.

cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26GHz.  cPython Kelvin probes can land on 0.4 mm pitch targets, and their tip spacing is 90 µm to land on small targets. cPython probes are available with homogeneous tips to optimize performance.

cViper Contactor / Probe Head

Radial wafer probe solution down to 100 µm pitch with low loop inductance and high bandwidth and optional manual actuator for testing singulated die

cViper ultra-fine-pitch probeheads for RF and high speed digital WLCSP and Known-Good-Die applications are ideal for lab and large volume production test of precision analog, RF, sensors and mobility devices. With low loop inductance, bandwidth up to 25 GHz, and low and stable contact resistance, cViper is an ideal choice for thorough testing of WLCSP and bumped die for MCM and COB applications. cViper probes are available in 100, 150, and 200 µm  minimum pitch and are manufactures with variety of contact materials to optimize performance.

ecoAmp Kelvin Contactor

Cantilever contactor for high power applications

ecoAmp Kelvin is a high power cantilever kelvin contactor with patented spring and tip design for optimum heat dissipation. This ensures best reliability, long spring life and high yield even under highest current and temperature requirements.

Gemini Kelvin Contactor / Probe Head

Industry preferred high performance, high value, low cost true kelvin QuadTech contacting solution

Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.

At 3.22 mm test height, the Gemini Kelvin is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The DUT side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.

ICON Coaxial Contactor

Coaxial production solution for testing high end digital applications to 60 Gbps

Designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).

The ICON’s metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise).

Mercury Contactor / Probe Head

Industry preferred high performance, high value, low cost QuadTech contacting solution

Mercury probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields. Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.

MiCon Contactor

Proven cantilever technology for MCUs and ASICs

MiCon is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.

MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.

nanoKelvin Contactor

Kelvin test socket for high power plunge-to-board applications

nanoKelvin is a well-established cantilever kelvin contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.

xWave Contactor / Probe Head

Highest performance and most robust RF broadband production solution for package, wafer, or OTA test to 100 GHz

The xWave contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.

In addition to wireless communication xWave contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.