Cost-Effective, High-Performance Contactor or Probe Head for High-Volume Production Test
cBoa test contactors (sockets) and probe heads (pins) are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe (pins) withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.
The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C. With a bandwidth up to 35 GHz @ -1 dB, cBoa can be used to test some of the highest frequency devices.
The enhanced compliance window accommodates package stack height tolerances well.