Semiconductor ATE Solutions for Power Management

Conserve, control and maximize

Cohu ATE Experience

  • Long history of testing power management devices crossing multiple markets
  • Focused instrumentation dedicated to providing high throughput

Applications

  • Broad range of PMIC devices
  • Automotive / industrial / battery management

Test System Solutions

Diamondx Test System

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

DxV Test System

Changes the Rules of Design Through to Production Test

The DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, small footprint, light weight, single box design
  • Air cooled with low ambient noise for office environment
  • Energy efficient, low power consumption
  • Ideal for lab development and high-volume production

ASL1000 Test System

Ideal for cost-sensitive analog, linear & discrete devices

ASL1000 Test System provides industry leading value by delivering a high throughput yet low-cost solution, both from a cost of test and cost of ownership perspective.

With its multisite capabilities, fast test times, and low cost of ownership, the ASL platform is the best in class solution for analog, linear and discrete market. Its wide range of low and high-power VIs together with the digital and time measurement capabilities provide a comprehensive test solution for cost sensitive linear and power management devices.

ASLx Test System

Next Generation Low-Cost Analog Test System for power management and linear markets

ASLx Test System provides industry leading value by delivering a high throughput yet low-cost solution, both from a cost of test and cost of ownership perspective. Multisite capabilities, fast test times, and low cost of ownership. Wide range of low and high-power VIs together with the digital and time measurement capabilities provide a comprehensive test solution for cost sensitive linear and power management devices.

Designed for the power management and linear markets, the ASLx provides infrastructure advancements extending the capabilities of the ASL platform, providing power, flexibility and cost conscious options while preserving the overall value based principles of the ASL platform.

Instrumentation Solutions

AWG

High Resolution Arbitrary Waveform Generator

  • 2 channels per board
  • 256K words of memory per channel
  • 26 bits resolution
  • THG greater than 100dB

DCTMx

Precision Data Converter Test Module

  • Precision linearity to 1 ppm
  • Single-ended, differential, and pseudo-differential connection
  • Testing ADCs and DACs, and class-D amplifiers with a single instrument

DIG-HSB

High Speed Waveform Digitizer

  • Dual channel, 14 Bit, 105 MSPS waveform digitizer
  • Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance.
  • Offers an analog bandwidth greater than 150 MHz

DPIN96

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

FPVIx

High Voltage, High Current Floating Programmable Power Supply

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
  • Expert mode to maximize energy efficiency of the instrument

FX Digital

32 Channel Digital Instrument

  • Fully independent programming of timing and level on every channel
  • Synchronization signaling to/from other instruments
  • Read/Write memory for generating digital protocols used in RF front end applications
  • Multi-site programming model
  • Full pattern sequencing at 200 Mbps

HDVI

High Density Voltage Current Instrument for Massive Multisite Test

  • Highest V/I pin density in the industry
  • Voltage/current supply (VIS) mode
  • Precision analog source (PAS) mode
  • Flexible triggering options
  • External input matrix

HPVIx

High Power Voltage/Current Programmable Power Source

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing

Multiwave

Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

QTMP

Quad time measurement processor

  • Four independent time measurement channels per board
  • Each channel has its own direct path to DUT which can be programmed over 3 voltage ranges and 3 selectable filters

VIS16

16 VI general purpose VI

  • Full four quadrant operation providing up to 100 mA per channel over a range of +/- 16 V.
  • High voltage options offer auto sequencing, synchronization bus, differential mode, and ripple inputs

VSX

Extended Range Voltage Source

  • 4 channels per board
  • Force voltage to 1250V
  • 10mA current source

XVI

14 Channel DC Instrument

  • ±0V, ±100mA, 150mA pulsed
  • Voltage force and measure accuracy: 0.03% of range
  • Current force and measure accuracy: ±(0.05% of range +5nA +0.002% range / V)
  • Differentatial measurement using two channels
  • Increased multisite scalability