Consumer Expertise

Helping customers bring innovative products to the world

Cohu Advantage

  • High throughput test, handling and interface solutions meeting the cost challenges of the consumer market
  • Best-in-class precision analog source and measurement technology
  • Flat Panel Display driver test capability available on a low-cost configurable SOC test platform
  • High volume vision inspection and metrology tools
  • Low-cost configurable test handler
  • Innovative test interface solutions

Applications

  • Digital TVs
  • Fitness wearables
  • FPD drivers
  • Gaming, GPU
  • Set-top box
  • Virtual and augmented reality
  • Voice user interface technology

Test Handler Solutions

Turret Test and Scan

Ismeca NY20

Highest Throughput for Fragile Devices

20-position turret platform for semiconductors test, inspection and packaging, providing the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.

The NY20 also integrates with Cohu’s latest advance inspection technologies such as, 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with high resolution camera.

Ismeca NY32

Highest Demanding Finishing Processes

32-position turret platform for semiconductors test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features that enables extended autonomous operation and productivity.

The NY32 also integrates Cohu’s latest advance inspection technologies such as, 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with high resolution camera.

Ismeca NY32W

Highest Inspection Yield for Wafer Level Chip Scale Packages and Bare Dies

32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enables extended autonomous operation and productivity.

The NY32W also integrates Cohu’s latest advanced inspection technologies such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection technology for sub-surface defect detection.

Inspection Solutions

WLCSP Inspection

Neon

Market Leading Inspection Yield with Uncompromised Throughput

Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in mobility and consumer applications.

Neon can handle fragile wafer level chip scale products at high speed, maintaining high operational efficiency while inspecting small devices down to 0.4 x 0.2 mm in size. It features extended process integration capabilities and can be configured with infrared and visual micro-scale defect inspection modules. It is also equipped with an external loader unloader to integrate with factory robots for customers adopting Industry 4.0 initiatives.

Neon  is designed to provide our customers with the best price/performance ratio in the industry, targeting semiconductors used in handset and small consumer electronics applications for high volume die sort needs.

Ismeca NY32W

Highest Inspection Yield for Wafer Level Chip Scale Packages and Bare Dies

32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as Intelligent Features that enables extended autonomous operation and productivity.

The NY32W also integrates Cohu’s latest advanced inspection technologies such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection technology for sub-surface defect detection.

NVcore Vision System

NVcore

Inspection to serve overall machine performance

NVcore is Cohu’s unique vision technology, enabling Advanced Inspection capabilities across Cohu’s handler portfolio.

NVcore latest Advance Inspection technologies include innovative solution such as, 3D Flex for 3-dimensional topographic inspection, sidewall micro-crack detection, and infrared inspection for sub-surface defect detection.

In addition to device quality inspection, by mastering the “all-in-one” solution, Cohu can offer unique capabilities for handler’s diagnostics and alignments, that enable the highest productivity performance.

Semiconductor ATE Solutions

Test Systems

Diamondx

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

DxV

Changes the Rules of Design Through to Production Test

he DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop

PAx

Market Leading Test System for High Volume RF PA / FEM, 5G and Mobility Devices

PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.

ASL1000

Ideal for cost-sensitive analog, linear and discrete devices

ASL1000 Test System provides industry leading value by delivering a high throughput yet low-cost solution, both from a cost of test and cost of ownership perspective. With its multisite capabilities, fast test times, and low cost of ownership, the ASL platform is the best in class solution for analog, linear and discrete market. Its wide range of low and high-power VIs together with the digital and time measurement capabilities provide a comprehensive test solution for cost sensitive linear and power management devices.

ASLx

Next Generation Low-Cost Analog Test System for power management and linear markets

Designed for the power management and linear markets, the ASLx provides infrastructure advancements extending the capabilities of the ASL platform, providing power, flexibility and cost conscious options while preserving the overall value based principles of the ASL platform.

MX

40 Instrument Slots, up to 512 Digital Pins

Instrumentation

Cohu has a number of instruments focused on consumer market

Test Contactor / Probe Head Solutions

ACE Contactor / Probe Head

RF (cmWave) probe with bandwidth up to 40GHz, Homogeneous tip, and long life

ACE test contactor offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm and superior performance for current consumption, gain, standard deviation, and power efficiency.

ACE probe head provides exceptional electrical performance, both DC and RF and is manufactured from HyperCore™ base material, which is a proprietary material of Cohu’s Everett Charles Technologies.

Compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors.

Atlas Contactor / Probe Head

QuadTech probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance

Atlas offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology.  The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.

The cruciform tip provides increased tip rigidity with a much greater immunity to breakage. The advantages for the customer include increased run times between contactor cleaning, increased probe life, increased yield, and reduced system down time for contactor maintenance.

cBoa Contactor / Probe Head

Uncompromised performance radial probe for the toughest test conditions

cBoa contactors and probe heads are the solution for contacting high frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogenous DUT side plunger provides longer run times between cleaning and increased probe life.

The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C. With a bandwidth up to 27 GHz, cBoa can be used to test some of the highest frequency devices.

The enhanced compliance window accommodates package stack height tolerances well.

cDragon Contactor

Excellent RF Performance and Reliability for Tri-Temperature Production Test with Low Cost of Ownership

cDragon pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.

By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.

cDragon’s low profile and high bandwidth with low inductance makes it an ideal contacting solution for testing of mobile communications, RF switches, A/D converters, LNA’s, and PMIC devices. cDragon’s pins affinity to solder migration will ensure low and repeatable contact resistance.

cDragon can be used for testing any perimeter pad devices (QFN, DFN) and leaded packages (QFP, SO).

cPython Kelvin Contactor / Probe Head

High Performance Kelvin Contact for High Volume Production Test

cPython Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.

cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.  cPython Kelvin probes can land on 0.4 mm pitch targets, and their tip spacing is 90 µm to land on small targets. cPython probes are available with homogeneous tips to optimize performance.

cViper Contactor / Probe Head

Radial wafer probe solution down to 100 µm pitch with low loop inductance and high bandwidth and optional manual actuator for testing singulated die

cViper ultra-fine-pitch probe heads for RF and high speed digital WLCSP and Known-Good-Die applications are ideal for lab and large volume production test of precision analog, RF, sensors and mobility devices. With low loop inductance, bandwidth up to 25 GHz, and low and stable contact resistance, cViper is an ideal choice for thorough testing of WLCSP and bumped die for MCM and COB applications. cViper probes are available in 100, 150, and 200 µm  minimum pitch and are manufactures with variety of contact materials to optimize performance.

Gemini Kelvin Contactor / Probe Head

Industry preferred high performance, high value, low cost true kelvin QuadTech contacting solution

Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.

At 3.22 mm test height, the Gemini Kelvin is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The DUT side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.

ICON Coaxial Contactor

Coaxial production solution for testing high end digital applications to 60 Gbps

Designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).

The ICON’s metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise).

Mercury Contactor

Industry preferred high performance, high value, low cost QuadTech contacting solution

Mercury probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields. Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.

RF Scrub Contactor

Excellent RF Performance with Low Cost of Ownership

Extremely short signal path rugged probe with high wear resistance for SO, DFN, and QFN packages

RF Scrub Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range (-40º C to +150º C).

The RF Scrub contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.

The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.

The RF Scrub contactor is adaptable to multiple packages (QFN/DFN/MLF, QFP, SO, SOT, TO) and handler platforms making it an ideal low-cost solution for your RF and acoustic applications.

xWave Contactor / Probe Head

Highest performance and most robust RF broadband production solution for package, wafer, or over the air (OTA) test to 100 GHz

The xWave contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.

In addition to wireless communication xWave contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.

Test Cell Solutions

MEMS Test Cell

Pre-validated Test Cells delivering fast ramp to production yield and throughput

Cohu is the only company with the expertise on the entire test cell and inspection and is recognized for its industry-leading suite of flexible and cost-effective MEMS test cell offerings. We work in close cooperation with our customers and leverage the cross functional expertise of Cohu’s product teams; semiconductor ATE, test handler and interface solutions.

Cohu provides a full pre-validated service within our facilities, to ensure that start up time at the customer site is minimized and target production yield and throughput are achieved in the fastest possible time.

Cohu has delivered more than 20 complete MEMS test cells to IDMs and OSATs in Asia, Europe and North America to address next-generation device test requirements and supplement existing production capacity.