Optimal Performance for Large I/O Count Devices and High End Digital Test
High Yields and Long Probe Life for Lower Cost of Ownership
QuadTech probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.
Atlas offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
The cruciform tip provides increased tip rigidity with a much greater immunity to breakage. The advantages for the customer include increased run times between contactor cleaning, increased probe life, increased yield, and reduced system down time for contactor maintenance.
Temperature range -55 ̊C to +155 ̊C.
Grid array packages: BGA, LGA, and WLCSP. Singulated packages, strip test, incarrier and wafer-scale parallel test
Optional Floating Alignment Plate
Fewer moving parts with optional floating alignment plate.
For breaking through oxides without damaging balls/pads. For large and multisite handler capability.
High Bandwidth/Low Loss
Improved digital signal data rate transfer. Increased digital wave spectral content. Less interconnect-induced signal jitter with a higher knee frequency insurances the digital signal edges are in the right place at the right time.
Cruciform tip provides extra strength with X-beam design