Cost-efficient RF contactor for fine pitch FBGA and wafer-level packages
Atlas™ Contactor / Probe Head
Optimal performance for large I/O count devices and high end digital test
cBoa™ Contactor / Probehead
Cost-efficient, high-performance contactor or probe head for high-volume production test
cCompact™ Contactor
Ideal for multisite testing of analog and smart power devices requiring kelvin test
cCruiser™ Contactor
Simplified and Cost Optimized Side-by-Side Contactor for Discrete and Small Logic ICs
cHybrid™ Turret Kelvin Contactor
For leaded and leadless devices
cDragon™ Contactor
Excellent RF performance and reliability for tri-temp production test
cGator™ Contactor
For Wide Bandgap Silicon Carbide and GaN High-Voltage and High-Current Known Good Die Applications
cPython™ Contactor or Probe Head
High Performance Kelvin Contact for High Volume Production Test
cRacer™ Contactor / Probe Head
Next-gen 5G mmWave FR2 up to 54+ GHz
cViper™ Contactor / Probe Head
High performance probe head for HV production test
ecoAmp™ Kelvin Contactor
Kelvin contactor for high power applications
Gemini™ Kelvin Contactor / Probe Head
Contactor for in-line and array packages
Hydra™ Contactor / Probe Head
Probe standardized and simplification designed for high-volume power and RF applications
ICON™ Coaxial Contactor
Production solution for testing high end digital applications to 70 Gbps
Mercury™ Contactor / Probe Head
Contactor for cost-efficient, high-performance test
MiCon™ Contactor / Probe Head
Proven Cantilever Technology for MCUs and ASICS
nanoKelvin™ Contactor
Kelvin contactor for high power plunge-to-board applications
RF Scrub™ Contactor
Excellent RF performance with low cost of ownership
xWave™ Contactor / Probe Head
Broadband production solution for cmWave and mmWave up to 100 GHz
Probe Cards
cRacer™ RF Probe Card
High-performance field repairable for lowest cost of test
