Semiconductor ATE Systems

Cohu’s Semiconductor ATE solutions are scalable platforms targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices.

Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.

Diamondx

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

High pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and MCU

DxV

Changes the rules of design through to production test

Full ATE performance in a desktop footprint for engineering lab or office.

PAx

Market leading test system for high volume RF PA/FEM, 5G and mobility

Delivering uncompromised RF performance in a low-cost system for testing next generation wireless standards

Semiconductor Tester ASLxASLx

Next generation low cost analog test system for power management and linear markets
Providing wide range of low and high-power VIs together with digital and time measurement

ASL1000

Ideal for cost-sensitive analog, linear and discrete devices
Providing industry leading value by delivering a high throughput yet low-cost solution

LX

20 Instrument Slots, up to 256 Digital Pins

Low-cost engineering configuration featuring limited function for engineering deployments or as a complete production configuration

MX

40 Instrument Slots, up to 512 Digital Pins

Architected to provide optimal cost of test for advanced RF wireless, power management, computing and automotive devices

EX

80 Instrument Slots, up to 1024 Digital Pins

Delivering high pin count and transparent multisite programs for high pin count SOC and SiP device testing