Cohu’s Semiconductor ATE solutions are scalable platforms targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices.
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
High pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and MCU
Changes the rules of design through to production test
Full ATE performance in a desktop footprint for engineering lab or office.
Market leading test system for high volume RF PA/FEM, 5G and mobility
Delivering uncompromised RF performance in a low-cost system for testing next generation wireless standards
Ideal for cost-sensitive analog, linear and discrete devices
Providing industry leading value by delivering a high throughput yet low-cost solution
20 Instrument Slots, up to 256 Digital Pins
Low-cost engineering configuration featuring limited function for engineering deployments or as a complete production configuration
40 Instrument Slots, up to 512 Digital Pins
Architected to provide optimal cost of test for advanced RF wireless, power management, computing and automotive devices
80 Instrument Slots, up to 1024 Digital Pins
Delivering high pin count and transparent multisite programs for high pin count SOC and SiP device testing