Cohu’s Semiconductor ATE solutions are scalable platforms targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices.
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
High pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and MCU
Changes the rules of design through to production test
Full ATE performance in a desktop footprint for engineering lab or office.
Market leading test system for high volume RF PA/FEM, 5G and mobility
Delivering uncompromised RF performance in a low-cost system for testing next generation wireless standards
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