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Semiconductor ATE Solutions for Industrial and Medical

Delivering solutions that automate the industry

Cohu Industrial Medical Market Test Solutions

Cohu ATE Experience

  • Long history of supporting medical customers
  • High-precision DAC and ADC measurement instrumentation and expertise
  • Leaders in DSP test techniques
  • Composite instrumentation optimizes the test system configuration

Applications

  • Convertors for medical devices and instrumentation
  • Touch-screen Display
  • Disk drive pre-amp read/write
  • CAN bus applications across diverse markets
  • Factory automation / DeviceNet
  • MCU with power management for implanted medical devices

Test System Solutions

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

Changes the Rules of Design Through to Production Test

The Diamondx DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, small footprint, light weight, single box design
  • Air-cooled with low ambient noise for an office environment
  • Energy-efficient, low power consumption
  • Ideal for lab development and high-volume production

Instrumentation Solutions

Automotive Test Composite Pin

  • Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
  • Reduced load board complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resources to DUT pin connections
  • Transient detect capability to capture perturbations at the device in program development or production test

Analog Time Measurement Processor

  • Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
  • Reduced loadboard complexity using the SmartMux for high voltage timing measurements

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

High Voltage, High Current Floating Programmable Power Supply

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
  • Expert mode to maximize energy efficiency of the instrument

32 Channel Digital Instrument

  • Fully independent programming of timing and level on every channel
  • Synchronization signaling to/from other instruments
  • Read/Write memory for generating digital protocols used in RF front end applications
  • Multi-site programming model
  • Full pattern sequencing at 200 Mbps

General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

High Power Voltage/Current Programmable Power Source

  • Fast throughput with high power pulsed mode operation
  • Transient detect capability to capture perturbations at the device in program development, or production test
  • Reduced loadboard complexity using the SmartMux for high voltage and current signal routing

Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level mixed-signal testing using deep send pattern memory

High Speed Solution for SerDes/LVDS/MIPI Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level testing using deep send and receive pattern memory

Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

4 Channel Floating VI for applications requiring higher power, floating VI

  • Full four quadrant operation providing pulsed current up to 5 A per channel over a range of +/- 60 V
  • Can be internally paralleled for operation up to 20 A and can be stacked up to 240 V
  • Auto sequencer, meter per-pin and ripple input

Quad time measurement processor

  • Four independent time measurement channels per board
  • Each channel has its own direct path to DUT which can be programmed over 3 voltage ranges and 3 selectable filters

Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices

  • Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
  • A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
  • A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument

Expertise

Learn more about our Semiconductor ATE Solutions