Semiconductor Tester Solutions for Consumer
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High throughput test solutions meeting the cost challenges of the consumer market.
Cohu Tester Experience
- Best-in-class precision analog source and measurement technology
- Flat Panel Display driver test capability available on a low-cost configurable SOC test platform
- Market leader in RF devices for cell phone and wireless devices
- Experts in near field communication test
Applications
- Mobile display
- Augmented Reality/Virtual Reality video
- Cell phones
- Smart home
- Disk drive preamp read/write
Test System Solutions
Diamondx Test System
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.
Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.
Diamondx DxV Test System
Changes the Rules of Design Through to Production Test
The Diamondx DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:
- Ultra-compact, small footprint, light weight, single box design
- Air-cooled with low ambient noise for an office environment
- Energy-efficient, low power consumption
- Ideal for lab development and high-volume production
PAx Test System
Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices
PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.
PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.
Instrumentation Solutions
DDP
Dynamic Digital Pins
- 16 Channels per board
- 33 MHz base frequency
- 66 MHz mux-mode rate
- 8M main vector memory depth
- 256K send and receive date memory with hardware de-serialization
- 256K asynchronous receive memory with hardware de-serialization
DIGHB
Hummingbird Digitizer (DIGHB)
The DIGHB is a four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer. It provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance.
It offers an analog bandwidth of up to 800 MHz.
The DIGHB is supported on PAx and Diamondx.
DIG-HR
High Resolution Digitizer
- Dual-channel parallel resource for capture and analysis of complex wave forms
- 512K words of memory per channel
- 16 bits resolution
- THD greater than 88dB
DOAL
Op Amp Loop Card
- Two complete Op Amp Loops
- Programmable pole/zero compensation
- VIO ranges from 100 μV to 100mV full scale
- On board 12-bit ADC for parallel measurements
DPIN-96
High-Value Solution for Testing Digital and Mixed-Signal Devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
DPS1x
High Performance Device Power Supply
- Multisite testing of multi-core application processors and other high current, low voltage devices
- Drop-in replacement for DPS16 with enhanced capabilities
Dragon RF
The benchmark RF Test Solution for 4G and Beyond
- Configurable with 16 or 32 Universal RF ports per module with an optional port to pin expander, doubling the number of RF ports to 64 pins
- 6 GHz RF modulated source and 8 GHz RF measure
- <1 ms RF settling time on level and frequency change
- Quad site and octal site RF source with single and dual synthesizer respectively
- Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements
- Real time Dynamic Range Enhancer (DRE) per RF measure path
- Compact footprint RF generators
- Industry-leading source muxing flexibility
- Latest RF Synthesizer technology
- Cross-platform test system software: Unison
- Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application
FX Digital
32 Channel Digital Instrument
- Fully independent programming of timing and level on every channel
- Synchronization signaling to/from other instruments
- Read/Write memory for generating digital protocols used in RF front end applications
- Multi-site programming model
- Full pattern sequencing at 200 Mbps
GX1x
General Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
- Flexible pattern memory allocations
- Multiple pattern generation
- Transmit and receive of digitized waveforms
- Pattern synchronization and control of DC and AC analog test instruments
HSI1x
Scalable, Cost-Efficient Solution for High Performance SerDes Test
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI2x
High Speed Solution for SerDes/LVDS/MIPI Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI3x
High-speed Multisite Solution for SerDes /LVDS /MIPI interfaces
- Optimized for testing clock embedded and clock-forward serial interfaces
- Ensures robust performance where bandwidth, power, and signal integrity matter most
- Seamless connectivity across critical system components
HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level testing using deep send and receive pattern memory
MP1x
Optimized Solution for LVDS Port and DDR Memory Port Test
- Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
- Supporting built-in memory protocol support
- Same cycle match capability to support for data latency of up to 8 cycles
PADPS1
Power Amplifier device power supply
- One measure FIFO per channel
- 4 Channels per Board
- Voltage: -2 V to +16 V
- Current: 2 A per channel
- 16 bit force/measure, parallel measure
- Channels can be ganged for higher currents
- 250 Ksps capture in 4096 memory
PD2x
Test Solution for Ultra High Definition Display Driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
PVI-100
Pulsed V/I – 100 Amp
- Fully floating instrument for the generation and measurement of high current pulses
- Allows both positive and negative pulses to be generated and keeps ground return currents from upsetting the rest of the system accuracy
- At the extremes, capable of generating 100A 20V pulses and 50V 1A pulses
RedDragon RF
5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7
- Only cost optimized ATE solution that covers sub-8.5 GHz with instrument extension to 18 GHz with high power
- Best-in-class ATE EVM and modulation bandwidth with faster acquisition times across frequency and ranges
- Single platform covering <4G, 5G sub-8.5 GHz, Wi-Fi 6/6E/7 and mmWave
- Seamless On-site Field Upgradable
- Significant increase in performance and throughput with minimal cost of change
SWG
Sequenced Waveform Generator (SWG)
- Dual channel, 16 Bit, 250 MSPS sequential and arbitrary waveform generator
- Sampler Clock Synthesizer can generate clock rates of 12.5 MHz to 400 MHz. Although the generator can only be closed to 250 MHz, the extra clocking range is available if needed for other test purposes
- Offers digital frequency up conversion and sequencer capabilities
VI1x
Precision Voltage/Current Source and Measurement with Advanced Features for Automotive and Industrial devices
- Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
- A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
- A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument
VIS16
Precision voltage/current source and measurement with advanced features
- Four Quadrant VI Source/Measure
- Ganging capability for extended current range
- 4:1 SmartMux
- Differential Vmeas
- +/-20 V / 300 mA, +/- 60 V / 100 Ma
- AWG and Digitizer Functions
Expertise
Learn more about our Semiconductor Tester Solutions.
