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Semiconductor ATE Solutions for Consumer

Connect, communication and entertain

 

Cohu Consumer Market Solutions

Cohu ATE Experience

  • High throughput test solutions meeting the cost challenges of the consumer market
  • Best-in-class precision analog source and measurement technology
  • Flat Panel Display driver test capability available on a low-cost configurable SOC test platform
  • Market leader in RF devices for cell phone and wireless devices
  • Experts in near field communication test

Applications

  • Mobile Display
  • Augmented Reality/Virtual Reality Video
  • Cell Phones
  • Smart Home
  • Disk drive preamp read/write

Test System Solutions

Diamondx Test System

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

PAx Test System

Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices

PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.

PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.

DxV Test System

Changes the Rules of Design Through to Production Test

The DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, small footprint, light weight, single box design
  • Air cooled with low ambient noise for office environment
  • Energy efficient, low power consumption
  • Ideal for lab development and high-volume production

MX Test System

40 Instrument Slots, up to 512 Digital Pins

MX Test System configuration is architected to provide optimal cost of test for advanced RF wireless, power management, computing and automotive devices. It offers high configurability, with small instrument channel increments, to produce system configurations with a lower cost of test than competitive platforms. The MX offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.

ASL1000 Test System

Ideal for cost-sensitive analog, linear & discrete devices

ASL1000 Test System provides industry leading value by delivering a high throughput yet low-cost solution, both from a cost of test and cost of ownership perspective.

With its multisite capabilities, fast test times, and low cost of ownership, the ASL platform is the best in class solution for analog, linear and discrete market. Its wide range of low and high-power VIs together with the digital and time measurement capabilities provide a comprehensive test solution for cost sensitive linear and power management devices.

ASLx Test System

Next Generation Low-Cost Analog Test System for power management and linear markets

ASLx Test System provides industry leading value by delivering a high throughput yet low-cost solution, both from a cost of test and cost of ownership perspective. Multisite capabilities, fast test times, and low cost of ownership. Wide range of low and high-power VIs together with the digital and time measurement capabilities provide a comprehensive test solution for cost sensitive linear and power management devices.

Designed for the power management and linear markets, the ASLx provides infrastructure advancements extending the capabilities of the ASL platform, providing power, flexibility and cost conscious options while preserving the overall value based principles of the ASL platform.

Instrumentation Solutions

DDP

Dynamic Digital Pins

  • 16 Channels per board
  • 33 MHz base frequency
  • 66 MHz mux-mode rate
  • 8M main vector memory depth
  • 256K send and receive date memory with hardware de-serialization
  • 256K asynchronous receive memory with hardware de-serialization

DIGHB

Hummingbird Digitizer (DIGHB)

The DIGHB is a four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer. It provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance.
It offers an analog bandwidth of up to 800 MHz.
The DIGHB is supported on PAx and Diamondx.

DIG-HR

High Resolution Digitizer

  • Dual-channel parallel resource for capture and analysis of complex wave forms
  • 512K words of memory per channel
  • 16 bits resolution
  • THD greater than 88dB

DOAL

Op Amp Loop Card

  • Two complete Op Amp Loops
  • Programmable pole/zero compensation
  • VIO ranges from 100 μV to 100mV full scale
  • On board 12-bit ADC for parallel measurements

DPIN-96

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

DPS1x

High Performance Device Power Supply

  • Multisite testing of multi-core application processors and other high current, low voltage devices
  • Drop-in replacement for DPS16 with enhanced capabilities

Dragon RF

The benchmark RF Test Solution for 4G and  Beyond

  • Configurable with 16 or 32 Universal RF ports per module with an optional port to pin expander, doubling the number of RF ports to 64 pins
  • 6 GHz RF modulated source and 8 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad site and octal site RF source with single and dual synthesizer respectively
  • Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements
  • Real time Dynamic Range Enhancer (DRE) per RF measure path
  • Compact footprint RF generators
  • Industry-leading source muxing flexibility
  • Latest RF Synthesizer technology
  • Cross-platform test system software: Unison
  • Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application

FX Digital

32 Channel Digital Instrument

  • Fully independent programming of timing and level on every channel
  • Synchronization signaling to/from other instruments
  • Read/Write memory for generating digital protocols used in RF front end applications
  • Multi-site programming model
  • Full pattern sequencing at 200 Mbps

GX1x

General Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

HSI1x

Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

MP1x

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

PADPS1

Power Amplifier device power supply

  • One measure FIFO per channel
  • 4 Channels per Board
  • Voltage: -2 V to +16 V
  • Current: 2 A per channel
  • 16 bit force/measure, parallel measure
  • Channels can be ganged for higher currents
  • 250 Ksps capture in 4096 memory

PD2x

Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

PVI-100

Pulsed V/I – 100 Amp

  • Fully floating instrument for the generation and measurement of high current pulses
  • Allows both positive and negative pulses to be generated and keeps ground return currents from upsetting the rest of the system accuracy
  • At the extremes, capable of generating 100A 20V pulses and 50V 1A pulses

Raven

The benchmark RF Test Solution for 5G, Ku-band and Beyond

Key Features

  • Configurable with 8 Universal RF ports per brick, up to 2 bricks per system
  • 75 GHz RF modulable source and 14.75 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad site and octal site RF source with single and dual synthesizer respectively
  • Up to 4 receiver paths per brick with an analog bandwidth exceeding 1 GHz for quad site parallel RF measurements
  • Real time Dynamic Range Enhancer (DRE) per RF measure path
  • Compact footprint RF generators
  • Industry-leading source muxing flexibility
  • Latest RF Synthesizer technology
  • Cross-platform test system software: Unison
  • Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application

SWG

Sequenced Waveform Generator (SWG)

  • Dual channel, 16 Bit, 250 MSPS sequential and arbitrary waveform generator
  • Sampler Clock Synthesizer can generate clock rates of 12.5 MHz to 400 MHz. Although the generator can only be closed to 250 MHz, the extra clocking range is available if needed for other test purposes
  • Offers digital frequency up conversion and sequencer capabilities

VIS16

16 VI general purpose VI

  • Full four quadrant operation providing up to 100 mA per channel over a range of +/- 16 V.
  • High voltage options offer auto sequencing, synchronization bus, differential mode, and ripple inputs