For Wide Bandgap Silicon Carbide and GaN High-Voltage and High-Current Known Good Die Applications
High-Power Known Good Die Test Contactor
MAXOR KGD™ (previously known as cGator) singulated power contactor is a top and bottom contacting solution for power Known Good Dies (KGD).
Cohu´s patent pending Volta-Flux™ MEMS probe architecture technology provides stable and low CRES for very challenging high-voltage and high-current requirements.
The gentle-touch feature reduces surface impacts to a minimum while providing a reliable contact force.
The Volta-Flux high-power density solution enables efficient die heat dissipation from top and bottom surface of the die under test.
MEMS probe technology enables smart stacking of pins to increase current carrying capability.
The cGator is designed to address the most common test parameters, for example:
- Off-state tests: BVDSS
- On-state tests: RDSon
- Unclamped Inductive load Switching / Avalanche tests
- Dynamic switching tests: Single pulse and double pulse inductive load switching
Green Energy Power Management
Electric Vehicles (xEV)
Key Features
High Voltage
High voltage parameter tests up to 6,500 V.
High Current
Dynamic Tests up to 5,000 A.
Heat Dissipation
Outstanding heat dissipation by Volta-Flux MEMS probe architecture.
Single Die Contacting Solution
Interfaces with up to four individual test stations with a single insertion.
Fast Testing
Low stray inductance enables fast switching of Wide Bandgap Dies.
Gentle Touch Contacting
Assurance of minimized imprint marks on Die materialization.
SiC and GaN Wide Bandgap Test Cell Solutions
Cohu’s production-proven test cell solutions enable the high-voltage and high-current requirements to ramp power bare die silicon carbide (SiC) MOSFETs and Schottky diodes, and gallium nitride high electron mobility transistors (GaN HEMTs) automotive and industrial devices. Patent pending Volta-flux high-power density solution enables identical contact elements for singulated power Known Good Die (KGD) and wafer probing, with field-replaceable MEMS probes providing significantly lower cost of test.
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