ULTRA S
Cantilever Spring Pin Test Contactor

Elastomer-Free Cantilever Test Interface Provides Tight Thermal Control, Higher Test Yield and Longer-Life Time

Durable. Long Lifespan. Higher Test Yield.

The ULTRA® S cantilever spring contactor is engineered for high yield and consistent performance in the most demanding environments. Unlike elastomer-based interfaces, ULTRA S eliminates performance degradation caused by compression set, temperature, and humidity exposure.

  • No Elastomer Degradation: Avoids the compression set and humidity effects typical of elastomers, ensuring stable mechanical and electrical properties over time.
  • Superior Electrical Consistency: Reduced contact resistance drift and mechanical variability result in higher and more stable test yields.
  • Lower Maintenance, Higher Uptime: With no elastomers to replace or manage in inventory, the system delivers increased test cell uptime and reduced maintenance costs.

Technical Advantages:

  • Supports 0.4 mm pitch and above
  • Handles high-current applications where conventional probe-based contactors fall short
  • Stationary board contact design eliminates wear and extends contact insertion life
  • Scales efficiently in high-parallel test setups, maintaining uniform contact force across sites
  • Addresses RdSON-related probe contact issues
  • Optimized for board pad offset and variable contact height scenarios

Unlike Elastomer-Based Interfaces ULTRA-S is Unaffected by Compression Set, Temperature, or Humidity

Power Management

Microcontroller

Radio Frequency

Key Features


Temperature Resilience

Tri-Temp range -60°C to +175°C. ULTRA S operates reliably across wide temperature ranges, including automotive-grade and high-temperature test environments.



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Electrical Performance

State-of-the-art electrical performance; outstanding pin-to-pin CRES stability 30.0 mΩ , 5.2 A continuous current carrying capability, and 15 GHz insertion loss @ -1 dB.



Tight Thermal Control

Integrated thermal air channels improve temperature accuracy at the device under test for improved and accurate temperature control.



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Long Lifespan and Lower Maintenance

Easily maintainable MEMS technology with self-cleaning micro-wipe. Long lasting cantilever springs reduce socket changeovers and downtime. Delivering a lower cost of ownership with fewer replacements, less cleaning, and lower maintenance frequency.



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Improved OEE

Simplified low-cost design reduces contact resistance drift and mechanical inconsistencies delivering improved yield. Productivity is increased by eliminating waste; maintenance downtime, scrap, and retests.



Easy Test Handler Integration

The design offers easy integration to most test handler platforms and is a drop-in replacement for traditional elastomer-based contactors.


Simplied Design Reduces Contact Resistance Drift and Mechanical Inconsistencies Delivering Improved Yield

Expertise

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