Spring Probe Test Contactor (Socket) / Probe Head Solutions
High Performance, Cost Effective Interface Solutions for High-Volume Production Test
There is really only one benefit: Low cost of ownership. The advantages listed above result in low initial cost, high test yields, and long probe life – all the necessary ingredients for low cost of ownership. And these benefits are available in test contactors (sockets) / probe heads that support a huge variety of device types, plating, pitches and application requirements.