Test Contactor for In-Line and Array Packages
Field-Proven Long-Life Test Contactor
At 3.22 mm test height, the Gemini Kelvin is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.
Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
Temperature range -55 ̊C to +155 ̊C.
BGA, QFN/DFN/MLF, QFP, SO, and wafer-level chip scale packages. Singulated devices, strip test, or wafer-level test.
Offset Tip Design
Minimum Kelvin-pair tip spacing 83 μm to land to small targets.
True Kelvin Contact
Electrically-isolated, mechanically independent force and sense probes.
Slotted Holes for Probes
Precision pointing accuracy ensures that probes avoid apex and edges of solder balls.
Probe Cleaning 50,000 t0 75,000.