Field-Proven Long-Life Test Contactor
At 3.22 mm test height, the Gemini Kelvin is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.
Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.
Temperature range -55 ̊C to +155 ̊C.
BGA, QFN/DFN/MLF, QFP, SO, and wafer-level chip scale packages. Singulated devices, strip test, or wafer-level test.
Minimum Kelvin-pair tip spacing 83 μm to land to small targets.
Electrically-isolated, mechanically independent force and sense probes.
Precision pointing accuracy ensures that probes avoid apex and edges of solder balls.
Probe Cleaning 50,000 t0 75,000.
Complete our contact form.
Learn more about our Interface Solutions