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cDragon Contactor

Excellent RF Performance with Low Cost of Ownership

cDragon Test Contactor (Socket) pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.

By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.

cDragon’s low profile and high bandwidth with low inductance makes it an ideal contacting solution for testing of mobile communications, RF switches, A/D converters, LNA’s, and PMIC devices. cDragon’s pins affinity to solder migration will ensure low and repeatable contact resistance.

cDragon can be used for testing any perimeter pad devices (QFN, DN, PLCC) and leaded packages (QFP, SO).

Product Sheet
Cohu cDragon Test Contactor

  • Key Features

    • Homogenous MEMS elastomer-free multi-beam pin
    • Low loop inductance and high bandwidth
    • Outstanding pin-to-pin CRES stability
    • Pitches down to 0.3 mm
    • Self-cleaning controlled scrub
    • Per-pin heat exchangers
    • Life cycle >1M Automated Test

  • Benefits

    • No loadboard wear and tear
    • Increased system uptime due to long life and low maintenance
    • Pin replacement in <5 minutes
    • Drop-in solution for existing high-performance setups
    • High test yield and mechanical reliability
    • Constant temperature at DUT ± 2ºC of handler setpoint typical
    • Temperature range -55°C to +175°C
    • Bandwidth 22 GHz @ -1 dB

  • Packages

    • SO
    • QFP
    • QFN
    • DN
    • PLCC
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