Advanced Temperature Performance
cDragon Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.
The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.
cDragon’s low profile and high bandwidth with low inductance makes it an ideal contacting solution for testing of mobile communications, RF switches, A/D converters, LNA’s, and PMIC devices. cDragon’s pins affinity to solder migration will ensure low and repeatable contact resistance.
cDragon can be used for testing any perimeter pad devices (QFN, DN, PLCC) and leaded packages (QFP, SO).
Temperature range -55 ̊C to +175 ̊C.
SO, QFP, QFN, DN, PLCC.
Improved at the device under test (DUT) temperature accuracy. Constant temperature at DUT ± 2ºC of handler setpoint typical.
Low self and loop inductance and excellent CRES stability through life.
Pin replacement in less than 5 minutes. No loadboard wear and tear. Drop-in solution for existing high performance setups.
Scrub contact with self-cleaning tip and no elastomers.
Complete our contact form.
Learn more about our Interface Solutions