The InCarrier process with the NY32-LU combines the advantages of the singulated device test with the advantages of high parallel strip test providing a high parallel solution with controlled and sensitive handling.
Loading into strip-like device carriers with Cohu’s loading equipment.
Combined advantages of singulated test and test-in-strip.
Wide applicable device range down to 0.8 x 0.8 mm. Leaded and leadless devices, IC test, MEMS calibration test, WL packages.
Input: Wafer, Tube, Tray, Bowl, Detape. Output: Tape & Reel, Bulk, Tube, Tray. InCarrier to Manual Loading.
Supports standard transportation media of the backend process.
Retest option for single devices in the same equipment.
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