Semiconductor ATE Solutions for Wireless / RF

Leader in Power Amplifier, Front-End Module and mmWave

Cohu ATE Experience

  • Industry leader in RF solutions
  • Long history of solving sophisticated wireless and RF test challenges
  • Unique compact and multisite RF test solution for all connectivity standards
  • Best-in-class RF measurement performance for Power Amplifier and Front-End Module Test
  • First automotive radar test cell in production

Applications

  • RF Power Amplifiers
  • RF Front End Modules
  • Automotive Radar
  • Wireless Routers

Test System Solutions

Diamondx Test System

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

PAx Test System

Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices

PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.

PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.

MX Test Systems

40 Instrument Slots, up to 512 Digital Pins

MX Test System configuration is architected to provide optimal cost of test for advanced RF wireless, power management, computing and automotive devices. It offers high configurability, with small instrument channel increments, to produce system configurations with a lower cost of test than competitive platforms. The MX offers a large suite of DC, power, DSP, RF and digital instrumentation that can be configured into a true mixed signal infrastructure.

RF Instrumentation Solutions

DragonRF

Highlights

  • High performance RF test capability
  • New levels of manufacturing test efficiencies

 Key Features

  • Configurable with 16 or 32 Universal RF ports per module with an optional port to pin expander, doubling the number of RF ports to 64 pins
  • 6 GHz RF modulable source and 8 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad site and octal site RF source with single and dual synthesizer respectively
  • Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements
  • Real time Dynamic Range Enhancer (DRE) per RF measure path
  • Compact footprint RF generators
  • Industry-leading source muxing flexibility
  • Latest RF Synthesizer technology
  • Cross-platform test system software: Unison
  • Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application

Kestrel

Radar Test System

  • Simple installation with no system modifications required
  • Supported on X-Series test systems
  • Proven solution for stringent automotive applications
  • Annual calibration cycles
  • Wide range of source and measure levels

Nighthawk

An ATE Paradigm Shift in RF Connectivity Test

Highlights

  • Ultra compact RF instrument
  • For the complete range of RF connectivity applications; WLAN, Bluetooth, Zigbee, GPS, DVB, FM and more

Key Features

  • Highest throughput enabled by real time processing, high speed PCI Express data transfer and full parallel source and measure
  • Benchtop instrument design and calibration strategy enables portability between Cohu systems typically less than 30 minutes
  • Annual calibration cycles
  • Built-in low jitter clock and baseband signaling

Raven

The benchmark RF Test Solution for 5G, Ku-band and Beyond

Highlights

  • High performance RF test capability
  • Highest levels of manufacturing test efficiencies

 Key Features

  • Configurable with 8 Universal RF ports per brick, up to 2 bricks per system
  • 14.75 GHz RF modulable source and 14.75 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad site and octal site RF source with single and dual synthesizer respectively
  • Up to 4 receiver paths per brick with an analog bandwidth exceeding 1 GHz for quad site parallel RF measurements
  • Real time Dynamic Range Enhancer (DRE) per RF measure path
  • Compact footprint RF generators
  • Industry-leading source muxing flexibility
  • Latest RF Synthesizer technology
  • Cross-platform test system software: Unison
  • Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application