High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test
InCarrier
Solution for Test in Strip
The InCarrier process is based on a strip-like device carrier for single devices.
PANTHER Power
All-in-One Test and Inspection System for small packaged ICs
PANTHER Power enables higher production yield with integrated test and inspection cell.
PANTHER WLCSP
High Performance Post Singulated Test
PANTHER WLCSP is a breakthrough technology in post singulation testing.
Rasco Jaguar
High Performance Strip Handler
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier.
