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High Parallel Test

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test


Solution for Test in Strip
The InCarrier process is based on a strip-like device carrier for single devices.


All-in-One Test and Inspection System for small packaged ICs
PANTHER Power enables higher production yield with integrated test and inspection cell.


High Performance Post Singulated Test
PANTHER WLCSP is a breakthrough technology in post singulation testing.

Rasco Jaguar

High Performance Strip Handler
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier.

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