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High Parallel Test

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test


Solution for Test in Strip
The InCarrier process is based on a strip-like device carrier for single devices.


All-in-One Test and Inspection System for small packaged ICs
PANTHER Power enables higher production yield with integrated test and inspection cell.

Cohu PANTHER WLCSP High Parallel Test HandlerPANTHER WLCSP

High Performance Post Singulated Test
PANTHER WLCSP is a breakthrough technology in post singulation testing.

Rasco Jaguar

High Performance Strip Handler
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier.


Learn more about our Test Handler and Inspection Solutions