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High Parallel Test

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test

InCarrier

Solution for Test in Strip
The InCarrier process is based on a strip-like device carrier for single devices.

Rasco Jaguar

High Performance Strip Handler
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier.

Expertise

Learn more about our Test Handler and Inspection Solutions