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High Parallel Test

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test

MCT FH-1200

High-Throughput Film Frame Handler
Designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages.


Solution for Test in Strip
The InCarrier process is based on a strip-like device carrier for single devices.

MCT MH-3300

High-Speed Laser Mark Handler
Designed for marketing of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marketing in strip test or assembly operations.

Cohu NY32-LUNY32-LU

InCarrier Loader/Unloader
Highly efficient and flexible loading / unloading of InCarrier, including vision inspection and final packaging.

Rasco Jaguar

High-Performance Strip Handler
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier.

MCT SH-5300

High-Performance Strip Handler
Designed for testing advanced semiconductor packages, LEDs, MEMs sensors, and traditional ICs.

Cohu Sense+ MEMS Sensor Test PlatformSense+

MEMS and Sensor Test
Next generation platform allowing for significant improvement in test accuracy, parallelism, and the ability to handle and inspect, small delicate sensors.


Learn more about our Test Handler Solutions