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High Parallel Test
High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test
MCT FH-1200
High-Throughput Film Frame Handler
Designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages.
InCarrier
Solution for Test in Strip
The InCarrier process is based on a strip-like device carrier for single devices.
MCT MH-3300
High-Speed Laser Mark Handler
Designed for marketing of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marketing in strip test or assembly operations.
NY32-LU
InCarrier Loader/Unloader
Highly efficient and flexible loading / unloading of InCarrier, including vision inspection and final packaging.
Rasco Jaguar
High-Performance Strip Handler
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier.
MCT SH-5300
High-Performance Strip Handler
Designed for testing advanced semiconductor packages, LEDs, MEMs sensors, and traditional ICs.
Sense+
MEMS and Sensor Test
Next generation platform allowing for significant improvement in test accuracy, parallelism, and the ability to handle and inspect, small delicate sensors.
Expertise
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