Designed for Optimal cmWave/mmWave Performance in Lab and Volume Production Test
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.
The xWave test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication xWave test contactors / probe head minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.
Temperature range -55 ̊C to +155 ̊C.
BGA, FBGA, LGA, QFN, and WLCSP.
Shortest possible path from DUT to tester, coplanar waveguide files.
Adaptable solution with Antennas positioned above/below/beside the DUT.
Includes USB drive with s-parameter calibration files.
Backhaul cellular network, WiGig and Wireless HD, and automotive radar applications.
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