xWave Test Contactor (Socket) / Probe Head (Pins)
Broadband Production Solution for cmWave and mmWave up to 100 GHz
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.
The xWave test contactor (socket) / probe head (pins) utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor (socket) / probe head (pins) are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication xWave test contactors (sockets) / probe head (pins) minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.