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Semiconductor ATE Solutions for Mobility

Enabling the explosive growth in data traffic and processing

Cohu Mobility Market Test Solutions

Cohu ATE Experience

  • Best-in-class RF measurement performance for Power Amplifier and Front-End Module test
  • Flat Panel Display driver test capability available on a low-cost configurable SOC test platform
  • Solutions for low-cost, low-pin count analog to SOC with flexible, scalable systems designed to grow with your needs
  • Expert support for high-power / high-current applications critical to automotive applications
  • Only company with the expertise across the complete test cell
  • High RF performance exceeds rigorous requirements of next gen wireless standards

Applications

  • 5G Connectivity
  • Augmented Reality/Virtual Reality Video
  • Mobile Display
  • Mobile Infrastructure

Test System Solutions

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

Market Leading Test System for High Volume RF PA & FEM, 5G and Mobility Devices

PAx test system delivers uncompromised RF performance in a low-cost system for testing RF power amplifiers and front-end modules for next generation wireless standards.

PAx’s flexible architecture allows configurations of a wide range of instruments that are designed to address the test challenges for RF power amplifiers and front-end modules used in cellular and connectivity applications, including WLAN standards up to Wi-Fi 6, 2G to 5G wireless and beyond, Bluetooth and a variety of IoT standards. Many of these new generation wireless devices require ever more demanding RF test capabilities from test instruments, such as wider bandwidths and lower EVM, and PAx’s configurable architecture delivers the optimized test solution with superior RF performance at a uncompromised cost of test.

Instrumentation Solutions

Hummingbird Digitizer (DIGHB)

The DIGHB is a four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer. It provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance.
It offers an analog bandwidth of up to 800 MHz.
The DIGHB is supported on PAx and Diamondx.

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

The benchmark RF Test Solution for 4G and  Beyond
Key Features

  • Configurable with 16 or 32 Universal RF ports per module with an optional port to pin expander, doubling the number of RF ports to 64 pins
  • 6 GHz RF modulated source and 8 GHz RF measure
  • <1 ms RF settling time on level and frequency change
  • Quad site and octal site RF source with single and dual synthesizer respectively
  • Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements
  • Real time Dynamic Range Enhancer (DRE) per RF measure path
  • Compact footprint RF generators
  • Industry-leading source muxing flexibility
  • Latest RF Synthesizer technology
  • Cross-platform test system software: Unison
  • Available across a range of Cohu test platforms thus ensuring the most cost-effective test capability no matter the end application

32 Channel Digital Instrument

  • Fully independent programming of timing and level on every channel
  • Synchronization signaling to/from other instruments
  • Read/Write memory for generating digital protocols used in RF front end applications
  • Multi-site programming model
  • Full pattern sequencing at 200 Mbps

General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

High Speed Solution for SerDes/LVDS/MIPI Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level testing using deep send and receive pattern memory

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers

Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

  • Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.

5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7

  • Only cost optimized ATE solution that covers sub-8.5 GHz with instrument extension to 18 GHz with high power
  • Best-in-class ATE EVM and modulation bandwidth with faster acquisition times across frequency and ranges
  • Single platform covering <4G, 5G sub-8.5 GHz, Wi-Fi 6/6E/7 and mmWave
  • Seamless On-site Field Upgradable
  • Significant increase in performance and throughput with minimal cost of change

Sequenced Waveform Generator (SWG)

  • Dual channel, 16 Bit, 250 MSPS sequential and arbitrary waveform generator
  • Sampler Clock Synthesizer can generate clock rates of 12.5 MHz to 400 MHz. Although the generator can only be closed to 250 MHz, the extra clocking range is available if needed for other test purposes
  • Offers digital frequency up conversion and sequencer capabilities

Expertise

Learn more about our Semiconductor ATE Solutions