Interface Solutions for Mobile
Enabling the explosive growth in data traffic and processing.
Intelligent contactor platform with a direct signal path for mmWave applications up to 100 GHz. Probe technology spanning 5G FR1 and FR2, high-density PMIC Kelvin contactors, also suitable for challenging package geometries.
Device Requirements
Contactor Requirements
Applications
HYDRA Series Contactor/Probe Head
Common Test Height Probe Product Line
Engineered for excellence and efficiency, HYDRA™ Series spring probe series offers precision, reliability, and standardized semiconductor test interface. Designed to be best-in-class at a competitive price point, HYDRA is optimized to maximize your operational efficiency. HYDRA is built to withstand demanding high-volume manufacturing test environments with its robust and durable design. With a common test-height, HYDRA offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, HYDRA streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
HYDRA RF Contactor / Probe Head
Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz
HYDRA RF utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.
HYDRA RF features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
HYDRA xW Contactor / Probe Head
Broadband Production Solution for cmWave and mmWave up to 100 GHz
The HYDRA xW contactor utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the HYDRA xW contactor are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
In addition to wireless communication HYDRA xW contactors minimize the number of transitions between the DUT and tester through the use of co-planar waveguide structures that make direct connection with the DUT, bypass the PCB, and connect to the tester with either coaxial cable or waveguides.
Complete our contact form.
Learn more about our Interface Solutions.