Production Solution for Testing High End Digital Applications up to 70 Gbps
Coaxial, Impedance-Controlled Test Contactor
The ICON test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).
The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.
ICON is ideal for FPGA, GPU, SerDes, DDR, PAM4, HDMI, PCIEx, SatCom, 5G mmWave RF Transceivers.
Temperature range -55 ̊C to +155 ̊C.
Suitable for BGA / LGA devices down to 0.8 mm. Singulated devices or strip test.
Current carrying capacity up to 1.7 A continuous.
Metal body reduces cross talk.
System impedance is not affected by proximity of device grounds.
Signal paths completely surrounded by ground from DUT to PCB pad.