MiCon
Proven Cantilever Technology for MCUs and ASICs.
Matches Existing Spring Pin Test Boards for an Easy and Cost-Efficient Conversion
The MiCon™ Test Contactor is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.
MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.
Key Features
Temperature
Temperature range -60 ̊C to +175 ̊C.
Packages
QFN/DFN/MLF, QFP, SO.
Electrical
Maximum peak current 24A @ 1% duty cycle. Maximum continuous current 2.0A.
Innovative Architecture
Durable one-piece design assures low and stable CRES.
Wide Contact Spring Tip
Accommodates devices lead trim and form variability. Accommodates device alignment accuracy.
Self-Cleaning Wipe
Application dependent wipe cleans the contactor with each insertion.
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Expertise
Learn more about our Interface Solutions
