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cHybrid Turret Kelvin Test Contactor (Socket)

For Leaded and Leadless Devices Down to 0.3 mm x 0.6 mm

Compact multi-beam pin structure for high density system integration on Turret Handlers with side-by-side design for very small pad sizes.

cHybrid Kelvin contactor (socket) contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multibeam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.

cHybrid Kelvin contactor (socket) with multibeam contact spring architecture delivers improved yield and long life which minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.

cHybrid Test Contactor
  • Features

    • Kelvin / non-Kelvin configuration available
    • Side-by-side for very small pad sizes
    • Smallest device size: 0.3 mm x 0.6 mm
    • Insertion loss 5 GHz @ -1 dB (S21)
    • Compact multi-beam pin structure for high density system integration

  • High Productivity

    • New Denmark pin material
      – Prevents solder migration
      – Long cleaning intervals – 50,000 cycles for pure pin
      – Lifetime more than 1 million cycles
    • No loadboard wear
    • Fast application board exchange without socket adjustment
    • Single pin replacement drives cost of test significantly down
    • Short index time due to innovative socket and system integration
  • Package Type

    • SO
    • SOT
  • Applications

    • Automotive and Power
    • Precision Analog and Sensors


Learn more about our Interface Solutions.