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Turret Test and Scan

Turret platforms for semiconductor test, inspection and packaging

Cohu NY20 Turret Test and Scan HandlerIsmeca NY20

Highest Throughput for Fragile Devices
20-position turret platform for semiconductor test, inspection and packaging.

Cohu NY32 Turret Test and Scan HandlerIsmeca NY32

Highest Demanding Finishing Processes
32-position turret platform for semiconductor test, inspection and packaging.

Cohu Ismeca NY32W Turret and Inspection Test HandlerIsmeca NY32W

Flexible Test and Scan Solution for FFC Devices
32-position turret platform for semiconductors on film-frame wafer media.

Cohu Neon WLCSP InspectionNeon

Market Leading Inspection Yield with Uncompromised Throughput
Next generation inspection platform optmized for small, fragile semiconductors used in mobility and consumer applications

Expertise

Learn more about our Test Handler and Inspection Solutions