Semiconductor Tester Solutions for Microcontrollers
Control, coordinate, and integrate.
Cost effective solutions providing full production and development toolset.
Cohu Tester Experience
Diamondx Test System
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.
Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.
Diamondx DxV Test System
Changes the Rules of Design Through to Production Test
The Diamondx DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:
Precision Data Converter Test Module
High-Value Solution for Testing Digital and Mixed-Signal Devices
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
High Density Voltage Current Instrument for Massive Multisite Test
Scalable, Cost-Efficient Solution for High Performance SerDes Test
High Speed Solution for SerDes/LVDS/MIPI Interfaces
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces
Optimized Solution for LVDS Port and DDR Memory Port Test
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs
Precision Voltage/Current Source and Measurement with Advanced Features
Precision voltage/current source and measurement with advanced features
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