Cohu ATE Experience
- High density instrumentation to deliver maximum throughput
- Broad experience testing high site count strip test
- Cost effective solutions providing full production and development toolset
Applications
- Automotive engine management
- White goods / Appliances
- Industrial instrumentation and process control
- Consumer products
- IoT
- Medical
Test System Solutions
Diamondx Test System
Flexible, Cost Optimized Test Solutions for the Most Challenging Applications
Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.
Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.
DxV Test System
Changes the Rules of Design Through to Production Test
The DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:
- Ultra-compact, small footprint, light weight, single box design
- Air cooled with low ambient noise for office environment
- Energy efficient, low power consumption
- Ideal for lab development and high-volume production
Instrumentation Solutions
DCTMx
Precision Data Converter Test Module
- Precision linearity to 1 ppm
- Single-ended, differential, and pseudo-differential connection
- Testing ADCs and DACs, and class-D amplifiers with a single instrument
DPIN96
High-Value Solution for Testing Digital and Mixed-Signal Devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
GX1x
General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing
- Flexible pattern memory allocations
- Multiple pattern generation
- Transmit and receive of digitized waveforms
- Pattern synchronization and control of DC and AC analog test instruments
HDVI
High Density Voltage Current Instrument for Massive Multisite Test
- Highest V/I pin density in the industry
- Voltage/current supply (VIS) mode
- Precision analog source (PAS) mode
- Flexible triggering options
- External input matrix
HSI1x
Scalable, Cost-Efficient Solution for High Performance SerDes Test
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI2x
High Speed Solution for SerDes/LVDS/MIPI Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSIO
8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level testing using deep send and receive pattern memory
MP1x
Optimized Solution for LVDS Port and DDR Memory Port Test
- Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
- Supporting built-in memory protocol support
- Same cycle match capability to support for data latency of up to 8 cycles
Multiwave
Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing
- Wide bandwidth analog source
- Wide bandwidth analog capture
- Flexible triggering
- High-precision PMU
- Protected I/O channels
- Simpler test boards
- Mixed-signal software support
PMVIx
Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs
- Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.
VI1x
Precision Voltage/Current Source and Measurement with Advanced Features
- V/I source mode
- AWG and digitizer functions
- Time measurement
- Differential voltage measurement
- Timers, triggers and gates
- Alarms
VIS16
16 VI general purpose VI
- Full four quadrant operation providing up to 100 mA per channel over a range of +/- 16 V.
- High voltage options offer auto sequencing, synchronization bus, differential mode, and ripple inputs
