Semiconductor ATE Solutions for Microcontroller

Control, coordinate and integrate

Cohu ATE Experience

  • High density instrumentation to deliver maximum throughput
  • Broad experience testing high site count strip test
  • Cost effective solutions providing full production and development toolset

Applications

  • Automotive engine management
  • White goods / Appliances
  • Industrial instrumentation and process control
  • Consumer products
  • IoT
  • Medical

Test System Solutions

Diamondx Test System

Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

DxV Test System

Changes the Rules of Design Through to Production Test

The DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, small footprint, light weight, single box design
  • Air cooled with low ambient noise for office environment
  • Energy efficient, low power consumption
  • Ideal for lab development and high-volume production

Instrumentation Solutions

DCTMx

Precision Data Converter Test Module

  • Precision linearity to 1 ppm
  • Single-ended, differential, and pseudo-differential connection
  • Testing ADCs and DACs, and class-D amplifiers with a single instrument

DPIN96

High-Value Solution for Testing Digital and Mixed-Signal Devices

  • Flexible timing
  • Reconfigurable pattern memory
  • Deep capture memory
  • High-precision PMU
  • Built-in time measurement
  • Super voltage
  • Comprehensive software tools

DPS16

DPS16 Device Power Supply
16-Channel Device Power Supply Instrument

  • Continuous voltage source
  • Voltage and current measurement

GX1x

General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments

HDVI

High Density Voltage Current Instrument for Massive Multisite Test

  • Highest V/I pin density in the industry
  • Voltage/current supply (VIS) mode
  • Precision analog source (PAS) mode
  • Flexible triggering options
  • External input matrix

HS1x

Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory

MP1x

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles

Multiwave

Highly Integrated Mixed-Signal Instrument for Multisite and Concurrent Testing

  • Wide bandwidth analog source
  • Wide bandwidth analog capture
  • Flexible triggering
  • High-precision PMU
  • Protected I/O channels
  • Simpler test boards
  • Mixed-signal software support

PMVIx

Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

  • Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.

VI1x

Precision Voltage/Current Source and Measurement with Advanced Features

  • V/I source mode
  • AWG and digitizer functions
  • Time measurement
  • Differential voltage measurement
  • Timers, triggers and gates
  • Alarms

VIS16

16 VI general purpose VI

  • Full four quadrant operation providing up to 100 mA per channel over a range of +/- 16 V.
  • High voltage options offer auto sequencing, synchronization bus, differential mode, and ripple inputs