You are here: / / / Flat Panel Display

Semiconductor Tester Solutions for Flat Panel Display

Watch, engage, and interact.

Diamondx high density digitizer instruments are engineered to meet the demanding test requirements of next-generation display driver ICs – from TDDI (Touch and Display Driver Integration) devices used in mobile and automotive applications to the latest Ultra-HD television drivers. Diamondx offers superior channel density and analog measurement capabilities, making it ideal for display driver, TDDI, and mixed-signal device testing.


Cohu Tester Experience


  • Flat Panel Display driver test capability on a low-cost configurable SOC test platform
  • Composite instrumentation that maximizes flexibility of the test system configurations
  • 320 per-pin digitizer channels, delivering 1 mV measurement accuracy, optimized continuity and leakage testing and high-speed data transport
  • Over 5,000 channels, supporting advanced multi-site test strategies that maximize throughput and minimize cost-of-test


Applications


  • Mobile display
  • Wearables and sport touch-screen display
  • Household applicances
  • In-vehicle entertainment
  • Television

Test System Solutions



Flexible, Cost Optimized Test Solutions for the Most Challenging Applications

Diamondx test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost driver’s IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.

Breakthrough cost reductions in both capital and operating costs for the automotive, mobility, IoT/IoV/Optoelectronics, industrial and medical, and consumer markets.

Proven capability in high-density digital, DC, analog instruments as well as technology leading precision analog, SerDes, RF and Automotive test makes the Diamondx test system suitable for today’s broad range of devices.

Read More about the Diamondx

Changes the Rules of Design Through to Production Test

The Diamonds DxV provides full semiconductor ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor ATE solutions that is no mainframe, separate workstation or support cabinets needed. The DxV is completely stand-alone, so it can be placed on a bench or desktop:

  • Ultra-compact, small footprint, light weight, single box design
  • Air-cooled with low ambient noise for an office environment
  • Energy-efficient, low power consumption
  • Ideal for lab development and high-volume production
Read More about the Diamondx DxV

Instrumentation Solutions



General-Purpose Digital Instrument for Digital SOC, Analog SOC and MCU Digital Testing

  • Flexible pattern memory allocations
  • Multiple pattern generation
  • Transmit and receive of digitized waveforms
  • Pattern synchronization and control of DC and AC analog test instruments
View the GX1x Product Sheet

High Density Voltage Current Instrument for Massive Multisite Test

  • Highest V/I pin density in the industry
  • Voltage/current supply (VIS) mode
  • Precision analog source (PAS) mode
  • Flexible triggering options
  • External input matrix
View the HDVI Product Sheet

Scalable, Cost-Efficient Solution for High Performance SerDes Test

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level mixed-signal testing using deep send pattern memory
View the HSI1x Product Sheet

High Speed Solution for SerDes/LVDS/MIPI Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level and mixed-signal testing using deep send pattern memory
View the HSI2x Product Sheet

High-speed Multisite Solution for SerDes /LVDS /MIPI interfaces

  • Optimized for testing clock embedded and clock-forward serial interfaces
  • Ensures robust performance where bandwidth, power, and signal integrity matter most
  • Seamless connectivity across critical system components
Download the HSI3x Product Sheet

8 Lane SerDes Instrument for Testing of High-Speed Serial Interfaces

  • Physical layer testing with built in PRBS BERT TX/RX
  • BIST/DFT testing using high bandwidth drive/compare memory
  • Protocol level testing using deep send and receive pattern memory
View the HSIO Product Sheet

Optimized Solution for LVDS Port and DDR Memory Port Test

  • Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
  • Supporting built-in memory protocol support
  • Same cycle match capability to support for data latency of up to 8 cycles
View the MP1x Product Sheet

Test Solution for Ultra High Definition Display Driver ICs

  • Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
  • Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
  • Extended range selection
  • 128k capture memory per channel
  • Industrial and automotive display drivers
View the PD1x/PD2x Product Sheet

Voltage/Current Source for Mobile Power Management, SOC, Automotive and MCU ICs

  • Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps.
View the PMVIx Product Sheet

Precision voltage/current source and measurement with advanced features

  • Four Quadrant VI Source/Measure
  • Ganging capability for extended current range
  • 4:1 SmartMux
  • Differential Vmeas
  • +/-20 V / 300 mA, +/- 60 V / 100 Ma
  • AWG and Digitizer Functions
View the VIS16 Product Sheet

Expertise

Learn more about our Semiconductor Tester Solutions.