NY20™ turret test handler is a 20-position turret platform test and inspection of high performance mixed signal, high frequency and sensor devices.
Highest Demanding Finishing Processes
The NY20 is a 20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
The NY20 also integrates with Cohu’s latest advanced inspection technologies such as 3D Flex for 3-dimensional topographic inspection and micro-crack detection algorithm with a high-resolution camera.
Featuring Cohu’s DI-Core Data Intelligence System providing real-time equipment monitoring and data analytics for Industry 4.0/Factory Automation.
Up to 8 Test Sites
6-sided Optical and Infrared Inspection
Available Options
- LED Testing (full flux or intensity)
- High Resolution Camera
- Laser Marking Integration
- Auto Reel Changer (ARC)
- Metal Magazine Input
Inspection Options
- Aquilae HR Sidewall: Micro-scale visible defect inspection down to 5 µm
- Aquilae Infrared: Inner cracks detection on silicon devices
- 3D Flex® Vision: True 3D inspection for Balls/Bumps
- Unique Twin Wafer and ViewMap to increase throughput
Data Analytics Options
DI-Core Data Intelligence System
- Real-time equipment monitoring and management
- Preventative Maintenance
- Central Recipe Management
- Knowledge Database and Unified Reports
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Expertise
Learn more about our Test Handler Solutions.
