MEMS Microphone Test
Sense+ with µ-sense. A unique solution for testing MEMS Microphones.
The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation MEMS microphones require highly accurate precision testing with signal-to-noise ratio (SNR) tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
The µ-sense™ test solution when combined with the Sense+™ automation platform delivers state-of-the-art testing of high-fidelity microphones with up to 96 devices under test in parallel. The µ-sense test solution provides precision measurements up to 78 dB signal-to-noise-ratio enabled by its unique patented technology. The isolated architecture conducts the tests in a low-sound environment significantly increasing test accuracy and output, with no need to stop handling for idle or silent mode. Providing up to 10K UPH, and with no special requirements for anechoic rooms or chambers on the production floor, the solution delivers cost-effective, high-throughput manufacturing for next generation high-fidelity microphones.
The Sense+ system features 32-position turret test and scan complete finishing solution with full 6-sided optical inspection. NV-Core Inspection System provides full final inspection and unit-level traceability from tray or bowl input to tape & reel output.
DI-Core Data Intelligence System provides real-time equipment monitoring and data analytics for increased productivity.
The µ-sense test solution can be mechanical de-coupled from the Sense+ system for use as a standalone unit for engineering in a lab environment.
Up to 78 dB SNR @ 140 dB SPL
2 x 1.5 mm – 5 x 5 mm
Scalable in production from 16 up to 96 sites in parallel
Ambient only
Full Port Down Process
The test solution can be used as a standalone unit for engineering or upgraded to a full production system.
DI-Core Data Intelligence System
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