cRacer
Lower Cost of Test for Next-Generation 5G mmWave FR2 up to 54+ GHz
High Signal Integrity and Power Delivery for RF Devices
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.
cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.
cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
Each probe pitch includes a cross section and probe technology expected to withstand the production environment for hundreds of thousands of insertions/cycles with low contact resistance. With a bandwidth up to 60+ GHz @-1 dB, cRacer is a cost-effective solution for your high frequency devices.
Key Features
Temperature
Features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55 ̊C to +155 ̊C.
Packages
BGA, FBGA, LGA, Pad, QFN, and WLCSP. Singulated packages, strip test and wafer-level chip scale test.
Optimized Dielectic Impedance
Matched impedance significantly improves insertion loss and return loss. Process can be applied at all pitches.
Low Loop Inductance and High Bandwidth
High signal integrity and power delivery for RF devices.
Floating Alignment Plate
Optional floating alignment plate provides higher continuity yield.
Variety of Contact Materials
Optimizing performance through resistance stability and longer usable life.
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Expertise
Learn more about our Interface Solutions
