Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz
The cRacer test contactor (sockets) and probe head (pins) portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.
cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.
cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
Each probe pitch includes a cross section and probe technology expected to withstand the production environment for hundreds of thousands of insertions/cycles with low contact resistance. With a bandwidth up to 54+ GHz @-1 dB, cRacer is a cost-effective solution for your high frequency devices.