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cRacer Test Contactor (Socket) / Probe Head (Pins)

Lowest COT for next-generation 5G mmWave FR2 up to 54+ GHz

The cRacer test contactor (sockets) and probe head (pins) portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.

cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 150 µm to 650 µm, covering the majority of 5G devices.

cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.

Each probe pitch includes a cross section and probe technology expected to withstand the production environment for hundreds of thousands of insertions/cycles with low contact resistance. With a bandwidth up to 54+ GHz @-1 dB, cRacer is a cost-effective solution for your high frequency devices.

Cohu cRacer FR2 mmWave contactor
  • Key Features

    • Variety of contact materials to optimize for DUT interconnect
    • Low loop inductance and high bandwidth
    • Pitches down to 150 µm
    • Optional floating alignment plate
    • Large compliance window
    • Excellent current carrying capacity
  • Benefits

    • Excellent resistance stability and prolonged usable life
    • Optimal contact for all package types
    • High signal integrity and power delivery for RF devices
    • Suitable for singulated packages, strip or wafer-level test
    • Excellent contact choice for all device types
  • Package Type

    • BGA
    • FBGA
    • LGA
    • Pad
    • QFN
    • WLCSP
    • Singulated packages, strip test and wafer level test

cRacer Concept – Achieving 54+ GHz

A technique to combine traditional spring probe technology with a dielectric-optimized socket architecture to reach 54+ GHz frequencies and deliver high yield with low cost-of-test.  Presented at TestConX 2021 by Peter Cockburn and Jason Mroczkowski, of  Cohu, Inc.


Learn more about our Interface Solutions.