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ACE Test Contactor (Socket) / WLCSP Probe Head (Pins)

Cost Efficient RF Contactor for FBGA and Wafer-Level Packages

RF (cmWave) probe (pins) with bandwidth up to 40 GHz, homogeneous tip, and long life.

ACE test contactor (socket) offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm and superior performance for current consumption, gain, standard deviation, and power efficiency.

ACE probe head (pins) provides exceptional electrical performance, both DC and RF and is manufactured from HyperCore™ base material, which is a proprietary material of Cohu’s Everett Charles Technologies.

Compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors (sockets).

Cohu ACE Test Contactor
  • Key Features

    • High frequency >40 GHz @ -1 dB
    • Exceptional DC and RF performance
    • Revolutionary barrel-less architecture
    • HyperCore – homogeneous DUT side plunger material
    • Large contact surface between top and bottom plungers
    • Singulated devices and strip test
    • BGA, LGA, QFN
    • Pitches down to 0.4 mm
  • Benefits

    • Compatible with all device types, plating, and pitches
    • Consistent electrical performance
    • Long life and lower cost of test
  • Package Type

    • BGA
    • QFN
    • LGA


Learn more about our Interface Solutions.