ACE Test Contactor (Socket) / WLCSP Probe Head (Pins)

Cost Efficient RF Contactor for FBGA and Wafer-Level Packages

RF (cmWave) probe (pins) with bandwidth up to 40 GHz, homogeneous tip, and long life.

ACE test contactor (socket) offers optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm and superior performance for current consumption, gain, standard deviation, and power efficiency.

ACE probe head (pins) provides exceptional electrical performance, both DC and RF and is manufactured from HyperCore™ base material, which is a proprietary material of Cohu’s Everett Charles Technologies.

Compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors (sockets).

Product Sheet

Key Features
High frequency >40 GHz @ -1 dB

Exceptional DC and RF performance

Revolutionary barrel-less architecture

HyperCore – homogeneous DUT side plunger material

Large contact surface between top and bottom plungers

Singulated devices and strip test

BGA, LGA, QFN

Pitches down to 0.4 mm