HYDRA RF
Test Contactor / Probe Head

Lower Cost of Test for Next-Generation 5G mmWave FR2 up to 56+ GHz

High Signal Integrity and Power Delivery for RF Devices

The HYDRA RF test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 56+ GHz.

HYDRA RF utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.

HYDRA RF features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.

Each probe pitch includes a cross section and probe technology expected to withstand the production environment for hundreds of thousands of insertions/cycles with low contact resistance. With a bandwidth up to 60+ GHz @-1 dB, HYDRA RF is a cost-effective solution for your high frequency devices.




Key Features


Temperature

Features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55 ̊C to +155 ̊C.



Packages

BGA, FBGA, LGA, Pad, QFN, and WLCSP. Singulated packages, strip test and wafer-level chip scale test.



Optimized Dielectic Impedance

Matched impedance significantly improves insertion loss and return loss. Process can be applied at all pitches.



Low Loop Inductance and High Bandwidth

High signal integrity and power delivery for RF devices.



Floating Alignment Plate

Optional floating alignment plate provides higher continuity yield.



Variety of Contact Materials

Optimizing performance through resistance stability and longer usable life.


Expertise

Learn more about our Interface Solutions