Elastomer-Free Cantilever Test Interface for Maximum Reliability and Yield
Durable. Long Lifespan. Higher Test Yield.
The ULTRA®-S cantilever spring contactor is engineered for high yield and consistent performance in the most demanding environments. Unlike traditional elastomer-based interfaces, ULTRA-S eliminates performance degradation caused by compression set, temperature, and humidity exposure.
- No Elastomer Degradation: Avoids the compression set and humidity effects typical of elastomers, ensuring stable mechanical and electrical properties over time.
- Superior Electrical Consistency: Reduced contact resistance drift and mechanical variability result in higher and more stable test yields.
- Lower Maintenance, Higher Uptime: With no elastomers to replace or manage in inventory, the system delivers increased test cell uptime and reduced maintenance costs.
Technical Advantages:
- Supports Kelvin Test at 0.4 mm pitch and above
- Handles high-current applications where conventional probe-based contactors fall short
- Stationary board contact design eliminates wear and extends contact insertion life
- Scales efficiently in high-parallel test setups, maintaining uniform contact force across sites
- Addresses RdSON-related probe contact issues
- Optimized for board pad offset and variable contact height scenarios
Power Amplifiers
Low Noise Amplifier
Key Features
Temperature Resilience
Tri-Temp range -55°C to +170°C. ULTRA-S operates reliably across wide temperature ranges, including automotive-grade and high-temperature test environments.
Electrical Performance
State-of-the-art electrical performance; outstanding pin-to-pin CRES stability 30.0 mΩ , 4.1 A continuous current carrying capability, and 15 GHz insertion loss @ -1dB.
Tight Thermal Control
Integrated thermal air channels improve temperature accuracy at the device under test for improved and accurate temperature control.
Long Lifespan and Lower Maintenance
Easily maintainable MEMS technology with self-cleaning micro-wipe. Long lasting spring probes reduce socket changeovers and downtime. Delivering a lower cost of ownership with fewer replacements, less cleaning, and lower maintenance frequency.
Improved OEE
Simplified low-cost design reduces contact resistance drift and mechanical inconsistencies delivering improved yield. Productivity is increased by eliminating waste; maintenance downtime, scrap, and retests.
Easy Test Handler Integration
The design offers easy integration to most test handler platforms and is a drop-in replacement for traditional elastomer-based contactors.
Simplified Single Piece Cantilever for Lower COT and Tight Thermal Control for Precision Analog Testing
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