Diamondx™ semiconductor tester is an air-cooled universal platform that can test the entire signal chain spanning power, RF, and MCU without spending unneeded platform overhead.
Flexible and Cost-Optimized Test Solutions
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
Proven capability in high-density digital, DC, analog instruments, as well as technology leading precision analog, SerDes, RF and Automotive test, makes the Diamondx test system suitable for today’s broad range of devices.
Diamondx’s universal test platform optimizes test parallelism for the entire Internet of Things (IoT) signal chain, including RF, power management and microcontroller devices. The RedDragon RF instrumentation suite for Diamondx enables testing of the expanding 5G frequencies, next generation Wi-Fi 7 and Ultra-Wideband (UWB) standards. Combined with high-density power management instruments, Diamondx delivers better throughput up to 480V testing capability in a flexible platform for IoT, high voltage data centers and electric vehicles.
Key Features
Universal Test Platform
Universal instrument slot architecture supporting 5-slot for small devices to 40-slot enabling over 500 multisite test parallelism.
Flexible and Scalable
Adaptable and scalable high-efficiency architecture to fit a range of multisite test strategies.
High Throughput
Extremely high-speed data bus based on PCI-Express industry standard configured for up to 80 Gbps bi-direction transfer between system CPU and test head.
Instrumentation
Over 7,500 pins configured with a wide range of digital, analog, and RF instruments.
Unison Software
Operating system offering a complete suite of test software tools, including scan test, concurrent test, adaptive test, unit level traceability multisite setup.
Energy-Efficient
Air-cooled architecture and instruments, no heat exchange or plumbing. Small Footprint and low-power consumption.
Instrumentation
A variety of instruments make the Diamondx suitable for testing today’s Wireless, Mobility, SOC, Flat Panel Display Drivers, Power Management, and Microcontrollers for the Automotive, Mobility, IoT/IoV and Optoelectronics, Data Center, Cloud and AI, Industrial and Medical, and Consumer markets.
Automotive Instrumentation
AT1x
Automotive test composite pin
- Composite Pin Instrument allowing for testing CAN and LIN, that conforms to SAE standards required for these automotive products
- Reduced load board complexity through CAN and LIN loads and LIN driver, along with integrated switch paths for multiple resources to DUT pin connections
- Transient detect capability to capture perturbations at the device in program development or production test
ATMPx
Analog time measurement processor
- Flexible timing measurements through per-pin programmable comparator levels and programmable hysteresis
- Reduced loadboard complexity using the SmartMux for high voltage timing measurements
PD1x / PD2x
Test solution for ultra-high definition display driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
VI1x
Precision voltage/current source and measurement with advanced features for automotive and industrial devices
- Advanced features such as a modulation generator and digitizer per channel enable the VI1x to be used for a wide variety of devices measurements
- A combination of internal and external triggers can be used for gating and sampling for maximum testing flexibility
- A time measurement unit measures rise and fall times, pulse, period, frequency and time difference, making the VI1x a truly versatile instrument
DC and Power Instrumentation
DPS1x
High-performance device power supply
- Multisite testing of multi-core application processors and other high current, low voltage devices
- Drop-in replacement for DPS16 with enhanced capabilities
DPS16
16-channel device power supply
- Continuous voltage source
- Voltage and current measurement
FPVIx
High-voltage, high-current floating programmable power supply
- Fast throughput with high power pulsed mode operation
- Transient detect capability to capture perturbations at the device in program development, or production test
- Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
- Expert mode to maximize energy efficiency of the instrument
HDVI
High-density voltage current instrument for massive multisite test
- Highest V/I pin density in the industry
- Voltage/current supply (VIS) mode
- Precision analog source (PAS) mode
- Flexible triggering options
- External input matrix
HPVIx
High-power voltage / current programmable power source
- Fast throughput with high power pulsed mode operation
- Transient detect capability to capture perturbations at the device in program development, or production test
- Reduced loadboard complexity using the SmartMux for high voltage and current signal routing
PD2x
Test solution for ultra-high definition display driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
PMVIx
Voltage /current source for mobile, power management, SOC, automotive and MCU ICs
- Meets the test challenges of integrated mobile power management devices with dozens of DC-DC and linear regulators ranging from under 100 mA to several amps
VIS16
Precision voltage / current source and measurement with advanced features
- Four Quadrant VI Source/Measure
- Ganging capability for extended current range
- 4:1 SmartMux
- Differential Vmeas
- +/-20 V / 300 mA, +/- 60 V / 100 Ma
- AWG and Digitizer Functions
VI1x
Precision voltage / current source and measurement with advanced features
- V/I source mode
- AWG and digitizer functions
- Time measurement
- Differential voltage measurement
- Timers, triggers and gates
- Alarms
Digital Instrumentation
DPIN-96
High-value solution for testing digital and mixed-signal devices
- Flexible timing
- Reconfigurable pattern memory
- Deep capture memory
- High-precision PMU
- Built-in time measurement
- Super voltage
- Comprehensive software tools
GX1x
General purpose digital instrument for digital SOC, analog SOC and MCU digital testing
- Flexible pattern memory allocations
- Multiple pattern generation
- Transmit and receive of digitized waveforms
- Pattern synchronization and control of DC and AC analog test instruments
HSI1x
Scalable, cost-efficient solution for high-performance SerDes test
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSI2x
High-speed solution for SerDes /LVDS /MIPI interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level and mixed-signal testing using deep send pattern memory
HSIO
8 lane SerDes instrument for testing of high-speed serial interfaces
- Physical layer testing with built in PRBS BERT TX/RX
- BIST/DFT testing using high bandwidth drive/compare memory
- Protocol level testing using deep send and receive pattern memories
MP1x
Optimized solution for LVDS port and DDR memory port test
- Matching the interface structure and requirements of a DDR memory controller for simplified DUT boards
- Supporting built-in memory protocol support
- Same cycle match capability to support for data latency of up to 8 cycles
Display Driver/Flat Panel Instrumentation
PD1x / PD2x
Test solution for ultra-high definition display driver ICs
- Integrated display drivers for mobile and tablet applications, including touch and display driver integration (TDDI)
- Large panel television and monitor applications, including ultra-high definition and 240Hz refresh rate
- Extended range selection
- 128k capture memory per channel
- Industrial and automotive display drivers
Mixed Signal and DSP Instrumentation
DIGHB
Hummingbird digitizer
- Four channel, 14 Bit, 400 MSPS or 16 Bit, 250 MSPS waveform digitizer
- Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance
- Offers an analog bandwidth of up to 800 MHz
- DIGHB is supported on PAx and Diamondx
Multiwave
Highly integrated mixed-signal instrument for multisite and concurrent testing
- Wide bandwidth analog source
- Wide bandwidth analog capture
- Flexible triggering
- High-precision PMU
- Protected I/O channels
- Simpler test boards
- Mixed-signal software support
DCTMx
Precision data converter test module
- Precision linearity to 1 ppm
- Single-ended, differential, and pseudo-differential connection
- Testing ADCs and DACs, and class-D amplifiers with a single instrument
RF Instrumentation
RedDragon RF
Test Module for 5G NR FR1/FR2, mmWave and Wi-Fi 6/6E/7
- Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz
- Immediate Wi-Fi 6/6E/7 including 7.126 GHz band
- Building blocks for 5G NR FR2 mmWave 23.45 – 48.5 GHz
- Configurable with up to 32 Universal RF ports
- Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure
- Noise source available on all ports
- RF Harmonic measure capability from 8 to 18 GHz using HMM
- 3 Channel AWG with Envelop Tracking Option
DragonRF
Industry leading RF source and receive with scalar and vector measure
- Extensive suite of capabilities designed to provide the lowest cost of test without any compromise in RF test performance
- Innovative flexible architecture enables scalable configurations with optimal return on investment without trade-off in test coverage or test time
- Configurable with 16 or 32 Vector RF ports
- 6 GHz RF modulated source and 8 GHz RF measure
- <1 ms RF settling time on level and frequency change
- Quad-site and octal-site RF source with single and dual synthesizer respectively
- Up to 8 receiver paths each with an analog bandwidth exceeding 200 MHz for octal site parallel RF measurements.
- Each receiver is connected to a digitizer with 14 bit @ 105 Msps
- Full modulation capability using SWG instrument providing 16 bits @ 250 Msps
- Swept S-parameter capability
- Servo loop tracking
- Real time Dynamic Range Enhancement
Application Solutions
Contact Sales
Complete our contact form.
Expertise
Learn more about our Semiconductor Tester Solutions.
Products
Sales and Service
Company
